Absorption, refraction and scattering retrieval with an edge-illumination-based imaging setup

We have recently developed a new method based on edge-illumination for retrieving a three-image representation of the sample. A minimum of three intensity projections are required in order to retrieve the transmission, refraction and ultra-small-angle scattering properties of the sample. Here we show how the method can be adapted for particular cases in which some degree of a priori information about the sample might be available, limiting the number of required projections to two. Moreover, an iterative algorithm to correct for non-ideal optical elements is proposed and tested on numerical simulations, and finally validated on experimental data

The effect of the spatial sampling rate on quantitative phase information extracted from planar and tomographic edge illumination x-ray phase contrast images

The effect of the spatial sampling rate on the quantitative phase information that can be retrieved from planar and tomographic edge illumination (EI) x-ray phase contrast imaging (XPCi) with a laboratory-based prototype scanner is analysed. The study is conducted on simulated and experimental data from a custom-built phantom. Optimal sampling rates, i.e. the minimum ones allowing the unambiguous extraction of quantitative phase measurements from the acquired data, are identified for planar and tomographic imaging. One of the key outcomes of this study is the demonstration that the optimal sampling rate in tomographic EI XPCi is low, allowing the implementation of low-dose volumetric imaging without having to compromise on quantitative accuracy