64 research outputs found

    First Progress Report of the Highway Bridge Impact Investigation

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    Division of Highways, State of IllinoisBureau of Public Roads, U.S. Department of Commerc

    The Physics of the B Factories

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    Physical analysis of Ti-migration in 33 Å gate oxide breakdown

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    Annual Proceedings - Reliability Physics (Symposium)210-215ARLP

    Nonlinear constrained optimizer and parallel processing for golden block line search

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    Generalized exponential penalty functions are constructed for the multiplier methods in solving nonlinear programming problems. The non-smooth extreme constraint Gext is replaced by a single smooth constraint Gs by using the generalized exponential function (base a>1). The well-known K.S. function is found to be a special case of our proposed formulation. Parallel processing for Golden block line search algorithm is then summarized, which can also be integrated into our formulation. Both small and large-scale nonlinear programming problems (up to 2000 variables and 2000 nonlinear constraints) have been solved to validate the proposed algorithms

    Size difference in dielectric-breakdown-induced epitaxy in narrow n- and p-metal oxide semiconductor field effect transistors

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    10.1063/1.1616195Applied Physics Letters83142940-2942APPL

    Gate Dielectric-Breakdown-Induced Microstructural Damage in MOSFETs

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    10.1109/TDMR.2004.824374IEEE Transactions on Device and Materials Reliability4138-4

    An Integrated Fouling Monitoring Technique for a Water Treatment Microfiltration Process

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    An integrated, online fouling monitoring technique that provides dynamic and real-time information of membrane fouling during a water treatment membrane process was developed. This technique has preliminarily been demonstrated for monitoring particulate fouling in a water treatment microfiltration process using a single photo sensor. The results of the online dynamic analysis suggest that this technique provides in situ measurement of fouling layer thickness, dynamic analysis of the fouling layer structure, and monitoring of water quality during the membrane filtration process

    Gate dielectric degradation mechanism associated with DBIE evolution

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    Annual Proceedings - Reliability Physics (Symposium)117-121ARLP

    Correlation of failure mechanism of constant-current-stress and constant-voltage-stress breakdowns in ultrathin gate oxides of nMOSFETs by TEM

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    10.1016/S0026-2714(03)00261-0Microelectronics Reliability439-111471-1476MCRL
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