Pattern Matching Analysis of Electron Backscatter Diffraction Patterns for Pattern Centre, Crystal Orientation and Absolute Elastic Strain Determination: Accuracy and Precision Assessment

Pattern matching between target electron backscatter patterns (EBSPs) and dynamically simulated EBSPs was used to determine the pattern centre (PC) and crystal orientation, using a global optimisation algorithm. Systematic analysis of error and precision with this approach was carried out using dynamically simulated target EBSPs with known PC positions and orientations. Results showed that the error in determining the PC and orientation was < 10$^{-5}$ of pattern width and < 0.01{\deg} respectively for the undistorted full resolution images (956x956 pixels). The introduction of noise, optical distortion and image binning was shown to have some influence on the error although better angular resolution was achieved with the pattern matching than using conventional Hough transform-based analysis. The accuracy of PC determination for the experimental case was explored using the High Resolution (HR-) EBSD method but using dynamically simulated EBSP as the reference pattern. This was demonstrated through a sample rotation experiment and strain analysis around an indent in interstitial free steel

Chiral Mass Splitting for c \bar{s} and c \bar{n} Mesons in the \tilde{U}(12)-Classification Scheme of Hadrons

We investigate the chiral mass splitting of parity-doubled J=0,1 states for c \bar{s} and c \bar{n} meson systems in the \tilde{U}(12)_{SF}-classification scheme of hadrons, using the linear sigma model to describe the light-quark pseudoscalar and scalar mesons together with the spontaneous breaking of chiral symmetry, and consequently predict the masses of as-yet-unobserved (0^{+},1^{+}) c \bar{n} mesons. We also mention some indications of their existence in the recent published data from the Belle and BABAR Collaborations.Comment: 5 pages, 1 figures, talk at the 11th International Conference on Hadron Spectroscopy, Rio de Janeiro, Brazil, 21-26 Aug 2005, to appear in the Proceeding