27 research outputs found

    Performance comparison of the exact run-length distribution between the run sum X and EWMA X charts

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    The run sum (RS) X and exponentially weighted moving average (EWMA) X charts are very effective in detecting small and moderate process mean shifts. The design of the RS X and EWMA X charts based on the average run length (ARL) alone, can be misleading and confusing. This is due to the fact that the run-length distribution of a control chart is highly right-skewed when the process is in-control or slightly out-of-control; while that for the out-ofcontrol cases, the run-length distribution is almost symmetric. On the other hand, the percentiles of the run-length distribution provide the probability of getting a signal by a certain number of samples. This will benefit practitioners as the percentiles of the run-length distribution give comprehensive information regarding the behaviour of a control chart. Accordingly, this paper provides a thorough study of the run-length properties (ARL, standard deviation of the run length and percentiles of the run-length distribution) for the RS X and EWMA X charts. Comparative studies show that the EWMA X chart outperforms the RS X charts for detecting small mean shifts when all the control charts are optimized with respect to a small shift size. However, the RS X charts surpass the EWMA X chart for all sizes of mean shifts when all the control charts are optimized with respect to a large shift size

    Comparative genome analysis of multiple vancomycin-resistant Enterococcus faecium isolated from two fatal cases

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    Enterococcus faecium is both a commensal of the human intestinal tract and an opportunistic pathogen. The increasing incidence of enterococcal infections is mainly due to the ability of this organism to develop resistance to multiple antibiotics, including vancomycin. The aim of this study was to perform comparative genome analyses on four vancomycin-resistant Enterococcus faecium (VREfm) strains isolated from two fatal cases in a tertiary hospital in Malaysia. Two sequence types, ST80 and ST203, were identified which belong to the clinically important clonal complex (CC) 17. This is the first report on the emergence of ST80 strains in Malaysia. Three of the studied strains (VREr5, VREr6, VREr7) were each isolated from different body sites of a single patient (patient Y) and had different PFGE patterns. While VREr6 and VREr7 were phenotypically and genotypically similar, the initial isolate, VREr5, was found to be more similar to VRE2 isolated from another patient (patient X), in terms of the genome contents, sequence types and phylogenomic relationship. Both the clinical records and genome sequence data suggested that patient Y was infected by multiple strains from different clones and the strain that infected patient Y could have derived from the same clone from patient X. These multidrug resistant strains harbored a number of virulence genes such as the epa locus and pilus-associated genes which could enhance their persistence. Apart from that, a homolog of E. faecalis bee locus was identified in VREr5 which might be involved in biofilm formation. Overall, our comparative genomic analyses had provided insight into the genetic relatedness, as well as the virulence potential, of the four clinical strains

    A study on the effects of trends due to inertia on EWMA and CUSUM charts

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    Unlike a Shewhart chart, the exponentially weighted moving average (EWMA) and cumulative sum (CUSUM) charts are memory control charts (also known as time weighted control charts) that are used for a quick detection of small shifts in the process mean. Control charts that combine information from present and past samples, like the EWMA and CUSUM charts have the ability to detect process changes based on past information. A trend could exist on the EWMA and CUSUM charts, where all the sample points fall in one particular direction on the charts, for example, only above or below the center line. For this case, if a shift in the process mean occurs in the opposite sides of the chart, then such a shift cannot be detected quickly. This phenomenon is known as the inertia problem. A simulation study is conducted using Statistical Analysis System (SAS) to study and compare the effects of inertia on EWMA and CUSUM charts. It is found that the EWMA chart is affected by the inertia problem but not the CUSUM char

    A comparison between the performances of double sampling X and variable sample size X charts

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    The double sampling (DS) X and variable sample size (VSS) X charts are very effective to detect small and moderate shifts in the process mean. Both charts are usually investigated under the assumption of known process parameters. However, the process parameters are commonly estimated from an in-control Phase-I dataset because they are usually unknown in practice. Therefore, both cases of known and estimated process parameters for the DS X and VSS X charts are considered in this paper. It is well known that the run length distribution of a control chart is highly skewed, especially when the process parameters are estimated and the process is in-control or slightly out-of-control. Interpretation based solely on a specific performance measure could be misleading. Thus, various performance measures need to be used to evaluate the properties of the control charts. Generally, the design of a control chart with estimated process parameters is proposed without comparing with other control charts. Accordingly, this paper focuses mainly on the comparison of the average run length (ARL), standard deviation of the run length (SDRL) and average sample size (ASS) between the DS X and VSS X charts with known and estimated process parameters. The ARL and SDRL results indicate that the DS X chart outperforms the VSS X chart for all ranges of shifts. However, the converse is true in terms of the ASS

    Malignant glandular triton tumor

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    Cancer6741076-1083CANC

    PEO surface-decorated silica nanocapsules and their application in in vivo imaging of zebrafish

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    10.1039/c2ra22472kRSC Advances23212392-1239
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