194 research outputs found
Mechanical Characterization of the Heat Affected Zone of Gold Wirebonds Using Nanoindentation
With increasing miniaturization in microelectronics the wirebonds used in IC packages are witnessing a thrust towards fine pitch wirebonding. To have a precise control over loop height of the wirebond for fine pitch wirebonding, it is imperative to do mechanical characterization of the wirebond. The present work studies the mechanical properties of gold wire and wirebond using nanoindentation. The wirebond specimen surface was planarized using mechanical polishing. The loop height of the gold wirebond is directly proportional to the length of the heat affected zone (HAZ) above the ball of gold wirebond. Metallographic preparation of gold wirebond cross section reveals the presence of undesirable coarse grain structure in HAZ due to recrystallization and grain growth in the gold wire adjacent to the ball. The recrystallization temperature of our gold wire was found using D.S.C. to be 340.66°C. The doping elements present in the gold wire used, were identified using TOF-SIMS. Nanoindentation of the gold wire was done at different maximum loads to observe the hardness variation with load. The nanoindentation of gold wirebond has confirmed a v-shaped hardness profile in the HAZ. The hardness minima for the particular gold wire used with a ball size ratio of 2.4 was observed at distance of 160-170 µm from the neck of the ball. The elastic modulus was found to vary randomly and to be independent of the microstructure in the wirebond. A yield stress profile based on empirical hardness-yield strength correlation has been predicted for the gold wirebond.Singapore-MIT Alliance (SMA
Influence of temperature humidity and defect location on delamination in plastic 1c packages
10.1109/6144.814966IEEE Transactions on Components and Packaging Technologies224512-518ITCP
Fracture mechanics analysis of delamination failures in I'C packages
10.1109/IPFA.2009.5232725Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA768-77
The importance of allowing for the variation of thermal properties in the numerical computation of temperature distribution in machining
Journal of Materials Processing Tech.281-249-58JMPT
Challenges of thermomechanical design and modeling of ultra fine-pitch wafer level packages
Proceedings of the 5th International Conference on Thermal and Mechanical Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2004601-90
Mechanics of interfacial delamination in IC packages undergoing solder reflow
10.1109/HDP.2005.2513802005 Conference on High Density Microsystem Design and Packaging and Component Failure Analysis, HDP'05
The role of simulation in failure prediction and design optimization in electronics packaging
10.1109/ESIME.2006.16440607th International Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, EuroSimE 20062006
A review of methods of calculating machining temperature
Journal of Materials Processing Tech.363225-257JMPT
Modeling of delamination in IC packages
10.1109/ICEPT-HDP.2012.6474744ICEPT-HDP 2012 Proceedings - 2012 13th International Conference on Electronic Packaging Technology and High Density Packaging854-86
RVE hybrid slim sector model for efficient analysis of solder joint reliability
10.1109/ECTC.2006.1645740Proceedings - Electronic Components and Technology Conference2006740-747PECC
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