27 research outputs found
Electrical conductivity of crack-template-based transparent conductive films: A computational point of view
Crack-template-based transparent conductive films (TCFs) are promising kinds
of junction-free, metallic network electrodes that can be used, e.g., for
transparent electromagnetic interference (EMI) shielding. Using image
processing of published photos of TCFs, we have analyzed the topological and
geometrical properties of such crack templates. Additionally, we analyzed the
topological and geometrical properties of some computer-generated networks. We
computed the electrical conductance of such networks against the number density
of their cracks. Comparison of these computations with predictions of the two
analytical approaches revealed the proportionality of the electrical
conductance to the square root of the number density of the cracks was found,
this being consistent with the theoretical predictions.Comment: 12 pages, 10 figures, 3 tables, 51 reference
Random 2D nanowire networks: Finite-size effect and the effect of busbar/nanowire contact resistance on their electrical conductivity
We have studied the resistance of two-dimensional random percolating networks
of zero-width metallic nanowires (rings or sticks). We toke into account the
nanowire resistance per unit length, the junction (nanowire/nanowire contact)
resistance, and the busbar/nanowire contact resistance. Using a mean-field
approximation (MFA), we derived the total resistance of the nanoring-based
networks as a function of their geometrical and physical parameters. We have
proposed a way of accounting for the contribution of the busbar/nanowire
contact resistance toward the network resistance. The MFA predictions have been
confirmed by our Monte Carlo (MC) numerical simulations. Our study evidenced
that the busbar/nanowire contact resistance has a significant effect on the
electrical conductivity when the junction resistance dominates over wire
resistance.Comment: 10 pages, 11 figures, 1 table, 33 reference
Percolation and electrical conduction in random systems of curved linear objects on a plane: computer simulations along with a mean-field approach
Using computer simulations, we have studied the percolation and the
electrical conductance of two-dimensional, random percolating networks of
curved, zero-width metallic nanowires. We mimicked the curved nanowires using
circular arcs. The percolation threshold decreased as the aspect ratio of the
arcs increased. Comparison with published data on the percolation threshold of
symmetric quadratic B\'{e}zier curves suggests that, when the percolation of
slightly curved wires is simulated, the particular choice of curve to mimic the
shape of real-world wires is of little importance. Considering the electrical
properties, we took into account both the nanowire resistance per unit length
and the junction (nanowire/nanowire contact) resistance. Using a mean-field
approximation (MFA), we derived the total electrical conductance of the
nanowire-based networks as a function of their geometrical and physical
parameters. The MFA predictions have been confirmed by our Monte Carlo
numerical simulations. For our random homogeneous and isotropic systems of
conductive curved wires, the electric conductance decreased as the wire shape
changed from a stick to a ring when the wire length remained fixed.Comment: 8 pages, 7 figures, 2 tables, 32 Refs.; Supplemental Material: 9
pages, 2 figures, 2 Ref