Electrical conductivity of crack-template-based transparent conductive films: A computational point of view

Crack-template-based transparent conductive films (TCFs) are promising kinds of junction-free, metallic network electrodes that can be used, e.g., for transparent electromagnetic interference (EMI) shielding. Using image processing of published photos of TCFs, we have analyzed the topological and geometrical properties of such crack templates. Additionally, we analyzed the topological and geometrical properties of some computer-generated networks. We computed the electrical conductance of such networks against the number density of their cracks. Comparison of these computations with predictions of the two analytical approaches revealed the proportionality of the electrical conductance to the square root of the number density of the cracks was found, this being consistent with the theoretical predictions.Comment: 12 pages, 10 figures, 3 tables, 51 reference

Random 2D nanowire networks: Finite-size effect and the effect of busbar/nanowire contact resistance on their electrical conductivity

We have studied the resistance of two-dimensional random percolating networks of zero-width metallic nanowires (rings or sticks). We toke into account the nanowire resistance per unit length, the junction (nanowire/nanowire contact) resistance, and the busbar/nanowire contact resistance. Using a mean-field approximation (MFA), we derived the total resistance of the nanoring-based networks as a function of their geometrical and physical parameters. We have proposed a way of accounting for the contribution of the busbar/nanowire contact resistance toward the network resistance. The MFA predictions have been confirmed by our Monte Carlo (MC) numerical simulations. Our study evidenced that the busbar/nanowire contact resistance has a significant effect on the electrical conductivity when the junction resistance dominates over wire resistance.Comment: 10 pages, 11 figures, 1 table, 33 reference

Percolation and electrical conduction in random systems of curved linear objects on a plane: computer simulations along with a mean-field approach

Using computer simulations, we have studied the percolation and the electrical conductance of two-dimensional, random percolating networks of curved, zero-width metallic nanowires. We mimicked the curved nanowires using circular arcs. The percolation threshold decreased as the aspect ratio of the arcs increased. Comparison with published data on the percolation threshold of symmetric quadratic B\'{e}zier curves suggests that, when the percolation of slightly curved wires is simulated, the particular choice of curve to mimic the shape of real-world wires is of little importance. Considering the electrical properties, we took into account both the nanowire resistance per unit length and the junction (nanowire/nanowire contact) resistance. Using a mean-field approximation (MFA), we derived the total electrical conductance of the nanowire-based networks as a function of their geometrical and physical parameters. The MFA predictions have been confirmed by our Monte Carlo numerical simulations. For our random homogeneous and isotropic systems of conductive curved wires, the electric conductance decreased as the wire shape changed from a stick to a ring when the wire length remained fixed.Comment: 8 pages, 7 figures, 2 tables, 32 Refs.; Supplemental Material: 9 pages, 2 figures, 2 Ref