Techno-Economic Assessment of Heat Supply Systems in Woodchip Drying Bases for Wood Gasification Combined Heat and Power

Among decentralized small-scale biomass energy sources with the potential to revitalize local communities, combined heat and power (CHP) from gasification is promising in terms of its high power generation efficiency. Still, it has yet to achieve operational stability, in part due to the variation in the moisture content of the woodchips used as fuel. In this study, a technical and economic evaluation was performed to establish a center for the efficient production of high-quality dry woodchips within a sawmill and to determine the technical characteristics and economic viability of a system using gasification CHP, wood waste-fired boilers or an organic Rankine cycle (ORC) as heat sources. The results showed that the net present values (NPVs) of gasified CHP, wood waste-fired boilers and ORC were −186 million, −402 million, and −103 million JPY, respectively. None of them were deemed profitable. Therefore, a sensitivity analysis was performed to determine the impact of low-quality wood prices, dry woodchips, heavy oil A, and the grid electricity charge on the NPV. The improvement of the low-quality wood price and dry woodchips sales price was effective for heat supply by gasification CHP and ORC turbines, and their combination was effective for woodchip-fired boilers

Characteristic Charge Collection Mechanism Observed in FinFET SRAM cells

The single event effects (SEEs) characteristics on 14/16-nm bulk Fin Field-Effect Transistors (FinFETs) were investigated in terms of single bit upsets (SBUs) and multiple cell upsets (MCUs). The sensitive area estimation based on the cross-section are also discussed

Characteristic Charge Collection Mechanism Observed in FinFET SRAM cells

Characteristics of single event effects on 14/16-nm bulk FinFETs and static random access memories (SRAM) composed of them were investigated in terms of single-bit upsets and multiple-cell upsets. The single-bit and multiple-cell upsets are analyzed and classified according to voltage, linear energy transfer of irradiated heavy ion, irradiation angle, data and fail bit patterns of SRAM. Estimation of sensitive areas based on cross-section is also discussed. Numerical simulations help to explain these phenomena, revealing along-fin effects on N-type FinFETs in the SRAM bit cell.Radiation Effects on Components and Systems (RADECS2020

Pruning of an MGTP Proof Tree Using Dynamic Lemma Generation and Its Implementation

Factorization used in resolution provers can be effectively applied to model generation provers in order to eliminate the redundancies in case splittings. We propose a new factorization-based technique called a static/dynamic lemma generation, and present its efficient implementation on MGTP(Model Generation Theorem Prover). Experimental results obtained by running MGTP with the technique for several problems from the TPTP library demonstrate the effectiveness of the proposed technique and implementation