Imaging with two-axis micromirrors

We demonstrate a means of creating a digital image by using a two axis tilt micromirror to scan a scene. For each different orientation we extract a single grayscale value from the mirror and combine them to form a single composite image. This allows one to choose the distribution of the samples, and so in principle a variable resolution image could be created. We demonstrate this ability to control resolution by constructing a voltage table that compensates for the non-linear response of the mirrors to the applied voltage.Comment: 8 pages, 5 figures, preprin

College of Arts and Sciences Drexel E-Repository and Archive (iDEA)

www.library.drexel.edu The following item is made available as a courtesy to scholars by the author(s) and Drexel University Library and may contain materials and content, including computer code and tags, artwork, text, graphics, images, and illustrations (Material) which may be protected by copyright law. Unless otherwise noted, the Material is made available for non profit and educational purposes, such as research, teaching and private study. For these limited purposes, you may reproduce (print, download or make copies) the Material without prior permission. All copies must include any copyright notice originally included with the Material. You must seek permission from the authors or copyright owners for all uses that are not allowed by fair use and other provisions of the U.S. Copyright Law. The responsibility for making an independent legal assessment and securing any necessary permission rests with persons desiring to reproduce or use the Material

Computer-aided design of free-space optoelectronic interconnection �FSOI� systems

This paper presents a system capable of static and dynamic simulations of heterogeneous opto-electronic systems. It is capable of modeling Gaussian optical signal propagation with mechanical tolerancing at the system level. We present results which demonstrate the system’s ability to predict the effects of various component parameters, such as detector geometry, and system level parameters, such as alignment tolerances, on system performance. 1