Quantitative analysis of ferroelectric domain imaging with piezoresponse force microscopy

The contrast mechanism for ferroelectric domain imaging via piezoresponse force microscopy (PFM) is investigated. A novel analysis of PFM measurements is presented which takes into account the background caused by the experimental setup. This allows, for the first time, a quantitative, frequency independent analysis of the domain contrast which is in good agreement with the expected values for the piezoelectric deformation of the sample and satisfies the generally required features of PFM imaging

Spin-1/2 Triangular Lattice with Orbital Degeneracy in a Metallic Oxide Ag2NiO2

A novel metallic and magnetic transition metal oxide Ag2NiO2 is studied by means of resistivity, magnetic susceptibility, specific heat and X-ray diffraction. The crystal structure is characterized by alternating stacking of a Ni3+O2 layer and a (Ag2)+ layer, the former realizing a spin-1/2 triangular lattice with eg orbital degeneracy and the latter providing itinerant electrons. It is found that the NiO2 layer exhibits orbital ordering at Ts = 260 K and antiferromagnetic spin ordering at TN = 56 K. Moreover, a moderately large mass enhancement is found for the itinerant electrons, suggesting a significant contribution from the nearly localized Ni 3d state to the Ag 5s state that forms a broad band.Comment: 9 pages, 5 figures, to be published in Rapid Communications, Phys. Rev.

Crosstalk Correction in Atomic Force Microscopy

Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to measure bending and torsion of the cantilever separately. A slight angle between the orientation of the photodiode and the plane of the readout beam, however, causes false signals in both readout channels, so-called crosstalk, that may lead to misinterpretation of the acquired data. We demonstrate this fault with images recorded in contact mode on ferroelectric crystals and present an electronic circuit to compensate for it, thereby enabling crosstalk-free imaging

Impact of Electrostatic Forces in Contact Mode Scanning Force Microscopy

In this $\ll$ contribution we address the question to what extent surface charges affect contact-mode scanning force microscopy measurements. % We therefore designed samples where we could generate localized electric field distributions near the surface as and when required. % We performed a series of experiments where we varied the load of the tip, the stiffness of the cantilever and the hardness of the sample surface. % It turned out that only for soft cantilevers could an electrostatic interaction between tip and surface charges be detected, irrespective of the surface properties, i.\,e. basically regardless its hardness. % We explain these results through a model based on the alteration of the tip-sample potential by the additional electric field between charged tip and surface charges

Sol-Gel Derived Ferroelectric Nanoparticles Investigated by Piezoresponse Force Microscopy

Piezoresponse force microscopy (PFM) was used to investigate the ferroelectric properties of sol-gel derived LiNbO$_3$ nanoparticles. To determine the degree of ferroelectricity we took large-area images and performed statistical image-analysis. The ferroelectric behavior of single nanoparticles was verified by poling experiments using the PFM tip. Finally we carried out simultaneous measurements of the in-plane and the out-of-plane piezoresponse of the nanoparticles, followed by measurements of the same area after rotation of the sample by 90$^{\circ}$ and 180$^{\circ}$. Such measurements basically allow to determine the direction of polarization of every single particle

Precision nanoscale domain engineering of lithium niobate via UV laser induced inhibition of poling

Continuous wave ultraviolet (UV) laser irradiation at lambda=244 nm on the +z face of undoped and MgO doped congruent lithium niobate single crystals has been observed to inhibit ferroelectric domain inversion. The inhibition occurs directly beneath the illuminated regions, in a depth greater than 100 nm during subsequent electric field poling of the crystal. Domain inhibition was confirmed by both differential domain etching and piezoresponse force microscopy. This effect allows the formation of arbitrarily shaped domains in lithium niobate and forms the basis of a high spatial resolution micro-structuring approach when followed by chemical etching

Anomalous temperature evolution of the internal magnetic field distribution in the charge-ordered triangular antiferromagnet AgNiO2

Zero-field muon-spin relaxation measurements of the frustrated triangular quantum magnet AgNiO2 are consistent with a model of charge disproportionation that has been advanced to explain the structural and magnetic properties of this compound. Below an ordering temperature of T_N=19.9(2) K we observe six distinct muon precession frequencies, due to the magnetic order, which can be accounted for with a model describing the probable muon sites. The precession frequencies show an unusual temperature evolution which is suggestive of the separate evolution of two opposing magnetic sublattices.Comment: 4 pages, 3 figure

Contrast Mechanisms for the Detection of Ferroelectric Domains with Scanning Force Microscopy

We present a full analysis of the contrast mechanisms for the detection of ferroelectric domains on all faces of bulk single crystals using scanning force microscopy exemplified on hexagonally poled lithium niobate. The domain contrast can be attributed to three different mechanisms: i) the thickness change of the sample due to an out-of-plane piezoelectric response (standard piezoresponse force microscopy), ii) the lateral displacement of the sample surface due to an in-plane piezoresponse, and iii) the electrostatic tip-sample interaction at the domain boundaries caused by surface charges on the crystallographic y- and z-faces. A careful analysis of the movement of the cantilever with respect to its orientation relative to the crystallographic axes of the sample allows a clear attribution of the observed domain contrast to the driving forces respectively.Comment: 8 pages, 8 figure