2 research outputs found
Synchrotron-based non-destructive diffraction-enhanced imaging systems to image walnut at 20 keV Journal of Food Measurement and Characterization
Synchrotron-based planar diffraction-enhanced
imaging system (Sy-DEI) and the combined system in
tomography mode (Sy-DEI-CT) has been used to acquire
the images of the walnut at 20 keV. Sy-DEI and Sy-DEICT
systems utilize the refraction properties of the X-rays,
when X-rays traversing the sample. These are identified as
phase-sensitive X-ray imaging systems, which uses the
phase shift rather than the absorption contrast as the
imaging signal and substantially increase the image contrast.
Walnut seeds are high density source of nutrients,
particularly proteins and essential fatty acids. Recently,
scientific evidence shows that, it offers health benefits,
when used as a source of food material. Knowing the
internal features by non-destructive methods are useful
compared to conventional methods. Systems based on
refraction properties are reliable for contrast enhancement
and visibility. At 20 keV, the changes in the hard part and
certain features of internal parts are clearly visible