Determination of density of states of thin high-TcT_c films by FET type microstructures

A simple electronic experiment with a field effect transistor type microstructure is suggested. The thin superconductor layer is the source-drain channel of the layered structure where an AC current is applied. It is necessary to measure the second harmonic of the source-gate voltage and third harmonic of the source-drain voltage. The electronic measurement can give the logarithmic derivative of the density of states which is an important parameter for fitting of parameters of the band structures.Comment: 3 pages, 1 figur

Limit theorems for maxima of heavy-tailed terms with random dependent weights

We study the general case when the weights Wj , j N can be dependent and in particular long-range dependent. Under mild tail and convergence conditions on the weights Wjs, we establish limit theorems for scaled versions of the process fMn(t)gt_0, as n ! 1. The limit processes are mixtures of extremal Frechet processes. The results are valid when the laws of the Uj’s belong to the normal domain of attraction of a Frechet distribution or to a sub-class of the general domain of attraction of a Frechet law