Facilitating the systematic nanoscale study of battery materials by atom probe tomography through in-situ metal coating

Through its capability for 3D mapping of Li at the nanoscale, atom probe tomography (APT) is poised to play a key role in understanding the microstructural degradation of lithium-ion batteries (LIB) during successive charge and discharge cycles. However, APT application to materials for LIB is plagued by the field induced delithiation (deintercalation) of Li-ions during the analysis itself that prevents the precise assessment of the Li distribution. Here, we showcase how a thin Cr-coating, in-situ formed on APT specimens of NMC811 in the focused-ion beam (FIB), preserves the sample's integrity and circumvent this deleterious delithiation. Cr-coated specimens demonstrated remarkable improvements in data quality and virtually eliminated premature specimen failures, allowing for more precise measurements via. improved statistics. Through improved data analysis, we reveal substantial cation fluctuations in commercial grade NMC811, including complete grains of LiMnO. The current methodology stands out for its simplicity and cost-effectiveness and is a viable approach to prepare battery cathodes and anodes for systematic APT studies

A versatile and reproducible cryo-sample preparation methodology for atom probe studies

Repeatable and reliable site-specific preparation of specimens for atom probe tomography (APT) at cryogenic temperatures has proven challenging. A generalized workflow is required for cryogenic-specimen preparation including lift-out via focused-ion beam and in-situ deposition of capping layers, to strengthen specimens that will be exposed to high electric field and stresses during field evaporation in APT, and protect them from environment during transfer into the atom probe. Here, we build on existing protocols, and showcase preparation and analysis of a variety of metals, oxides and supported frozen liquids and battery materials. We demonstrate reliable in-situ deposition of a metallic capping layer that significantly improve the atom probe data quality for challenging material systems, particularly battery cathode materials which are subjected to delithiation during the atom probe analysis itself. Our workflow designed is versatile and transferable widely to other instruments

In-situ metallic coating of atom probe specimen for enhanced yield, performance, and increased field-of-view

Atom probe tomography requires needle-shaped specimens with a diameter typically below 100 nm, making them both very fragile and reactive, and defects (notches at grain boundaries or precipitates) are known to affect the yield and data quality. The use of a conformal coating directly on the sharpened specimen has been proposed to increase yield and reduce background. However, to date, these coatings have been applied ex-situ and mostly are not uniformly. Here, we report on the controlled focused ion beam in-situ deposition of a thin metal film on specimens immediately after specimen preparation. Different metallic targets e.g. Cr were attached to a micromanipulator via a conventional lift-out method and sputtered using the Ga or Xe ions. We showcase the many advantages of coating specimens from metallic to non-metallic materials. We have identified an increase in data quality and yield, an improvement of the mass resolution, as well as an increase in the effective field-of-view enabling visualization of the entire original specimen, including the complete surface oxide layer. The ease of implementation of the approach makes it very attractive for generalizing its use across a very wide range of atom probe analyses