Ionization Structure and the Reverse Shock in E0102-72

The young oxygen-rich supernova remnant E0102-72 in the Small Magellanic Cloud has been observed with the High Energy Transmission Grating Spectrometer of Chandra. The high resolution X-ray spectrum reveals images of the remnant in the light of individual emission lines of oxygen, neon, magnesium and silicon. The peak emission region for hydrogen-like ions lies at larger radial distance from the SNR center than the corresponding helium-like ions, suggesting passage of the ejecta through the "reverse shock". We examine models which test this interpretation, and we discuss the implications.Comment: 4 pages, 6 figures; To appear in "Young Supernova Remnants" (11th Annual Astrophysics Conference in Maryland), S. S. Holt & U. Hwang (eds), AIP, New York (2001

Spectral Line Imaging Observations of 1E0102.2-7219

E0102-72 is the second brightest X-ray source in the Small Magellanic Cloud and the brightest supernova remnant in the SMC. We observed this SNR for ~140 ksec with the High Energy Transmission Gratings (HETG) aboard the Chandra X-ray Observatory. The small angular size and high surface brightness make this an excellent target for HETG and we resolve the remnant into individual lines. We observe fluxes from several lines which include O VIII Ly$\alpha$, Ly$\beta$, and O VII along with several lines from Ne X, Ne IX and Mg XII. These line ratios provide powerful constraints on the electron temperature and the ionization age of the remnant.Comment: To appear in "Young Supernova Remnants" (11th Annual Astrophysics Conference in Maryland), S. S. Holt & U. Hwang (eds), AIP, New York (2001

High-precision figure correction of x-ray telescope optics using ion implantation

ABSTRACT Achieving both high resolution and large collection area in the next generation of x-ray telescopes requires highly accurate shaping of thin mirrors, which is not achievable with current technology. Ion implantation offers a promising method of modifying the shape of mirrors by imparting internal stresses in a substrate, which are a function of the ion species and dose. This technique has the potential for highly deterministic substrate shape correction using a rapid, low cost process. Wafers of silicon and glass (D-263 and BK-7) have been implanted with Si+ ions at 150 keV, and the changes in shape have been measured using a Shack-Hartmann metrology system. We show that a uniform dose over the surface repeatably changes the spherical curvature of the substrates, and we show correction of spherical curvature in wafers. Modeling based on experiments with spherical curvature correction shows that ion implantation could be used to eliminate higher-order shape errors, such as astigmatism and coma, by using a spatially-varying implant dose. We will report on progress in modelling and experimental tests to eliminate higher-order shape errors. In addition, the results of experiments to determine the thermal and temporal stability of implanted substrates will be reported

Dimensinal metrology for nanometre-scale science and engineering: Towards sub-nanometre accurate encodders

Abstract Metrology is the science and engineering of measurement. It has played a crucial role in the industrial revolution at the milli-inch length scale and in the semiconductor revolution at the micrometre length scale. It is often proclaimed that we are standing at the threshold of another industrial revolution, brought by the advent and maturing of nanotechnology. We argue that for nanotechnology to have a similarly revolutionary effect a metrology infrastructure at and below the nanometre scale is instrumental and has yet to be developed. This paper focuses on dimensional metrology, which concerns itself with the measurement of lengths and its applications such as pattern placement and feature size control. We describe our efforts to develop grating-and grid-based scales with sub-nanometre accuracy over 300 mm dimensions using the nanoruler-a scanning-beam interference lithography tool

The Chandra High Energy Transmission Grating: Design, Fabrication, Ground Calibration and Five Years in Flight

Details of the design, fabrication, ground and flight calibration of the High Energy Transmission Grating, HETG, on the Chandra X-ray Observatory are presented after five years of flight experience. Specifics include the theory of phased transmission gratings as applied to the HETG, the Rowland design of the spectrometer, details of the grating fabrication techniques, and the results of ground testing and calibration of the HETG. For nearly six years the HETG has operated essentially as designed, although it has presented some subtle flight calibration effects.Comment: 34 pages (including 30 figures), accepted for publication in PAS