Optical Antennas For Vector Near-Field Imaging

A new method for nano-engineering the optical antenna properties of scanning probe tips by combining focused ion beam milling with nano-CVD is presented. We demonstrate the capabilities by probing specific vector-field components of plasmonic nanostructures. ©2009 IEEE

Summary of Chalcogenide Glass Processing: Wet-Etching and Photolithography

This report describes a study designed to explore the different properties of two different chalcogenide materials, As2S3 and As24S38Se38, when subjected to photolithographic wet-etching techniques. Chalcogenide glasses are made by combining chalcogen elements S, Se, and Te with Group IV and/or V elements. The etchant was selected from the literature and was composed of sodium hydroxide, isopropyl alcohol, and deionized water and the types of chalcogenide glass for study were As2S3 and As24S38Se38. The main goals here were to obtain a single variable etch rate curve of etch depth per time versus NaOH overall solution concentration in M and to see the difference in etch rate between a given etchant when used on the different chalcogenide stoichiometries. Upon completion of these two goals, future studies will begin to explore creating complex, integrated photonic devices via these methods

Optical Antennas For Vector Near-Field Imaging

A new method for nano-engineering the optical antenna properties of scanning probe tips by combining focused ion beam milling with nano-CVD is presented. We demonstrate the capabilities by probing specific vector-field components of plasmonic nanostructures. © 2011 OSA

A Nano-Optical Vector Network Analyzer

We reconstruct the magnetic near-field and source current distribution of a linear coupled-dipole IR optical antenna from the complete 3D electric vector near-field as probed using scattering-type scanning near-field optical microscopy. Fine details associated with antenna coupling are observed. © 2010 Optical Society of America

Determination Of Electric-Field, Magnetic-Field, And Electric-Current Distributions Of Infrared Optical Antennas: A Near-Field Optical Vector Network Analyzer

In addition to the electric field E(r), the associated magnetic field H(r) and current density J(r) characterize any electromagnetic device, providing insight into antenna coupling and mutual impedance. We demonstrate the optical analogue of the radio frequency vector network analyzer implemented in interferometric homodyne scattering-type scanning near-field optical microscopy for obtaining E(r), H(r), and J(r). The approach is generally applicable and demonstrated for the case of a linear coupled-dipole antenna in the midinfrared spectral region. The determination of the underlying 3D vector electric near-field distribution E(r) with nanometer spatial resolution and full phase and amplitude information is enabled by the design of probe tips with selectivity with respect to E and E fabricated by focused ion-beam milling and nano-chemical-vapor-deposition methods. © 2010 The American Physical Society