Diagnostics of Various Phenomena in LV Devices Under Real Switching Conditions

The article deals with issues to be tackled when performing experiments with low voltage devices under real switching conditions and subsequently discusses various phenomena in an experimental device. The first part describes optimum setting of diagnostic equipment - mainly for optical diagnostic methods. The second part describes some phenomena encountered during switching process under real switching conditions - arc roots movement (cathode and anode spots). These phenomena are not only important for experimental study itself but also form necessary input data for numerical models and their validation