DIAGNOSIS OF EDGE LOCALIZED MODE EVOLUTION IN DIII-D USING FAST-GATED CID AND INFRARED CAMERAS

The tangentially viewing visible and vertically viewing infrared cameras systems on DIII-D were upgraded to permit emission measurements during edge localized modes (ELMs) with integration times as short as 1 and 100 {micro}s respectively. The visible system was used to obtain 2-D poloidal profiles of CIII (465 nm) and D{sub {alpha}} (656.3 nm) emission with 20 {micro}s integration during various stages of ELM events in the lower DIII-D divertor. The infrared (IR) system was used to measure the heat flux to the divertor targets at 10 kHz with 100 {micro}s exposure. Upgrades to the data processing and storage systems permitted efficient comparison of the temporal evolution of these measurements