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1 research outputs found
The effects of carbon on the bidirectional threshold voltage instabilities induced by negative gate bias stress in GaN MIS-HEMTs
Author
A Armstrong
A Chini
+35 more
A Chini
A Fariza
A Guo
A Soni
Alessandro Chini
C Koller
D Marcon
E Bahat-Treidel
E Ber
E Dogmus
F Iucolano
F Sang
Francesco Maria Puglisi
G Dutta
G Meneghesso
G Sabui
G Verzellesi
Giovanni Verzellesi
H Amano
J He
JA Del Alamo
JL Lyons
KJ Chen
M Hua
M Hua
M Matsubara
M Meneghini
MJ Uren
N Zagni
N Zagni
Nicolò Zagni
Paolo Pavan
SQGW Bao
V Joshi
V Joshi
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
No full text
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