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1 research outputs found
The evolution of total internal reflection Raman spectroscopy for the chemical characterization of thin films and interfaces
Author
A Abbas
AJ Braundmeier
+83Â more
AM Jubb
B Pettinger
C Fu
C Lee
C Ota
CA Damin
CG Zimba
CG Zimba
Charles K. A. Nyamekye
CKA Nyamekye
CKA Nyamekye
CS Allen
CS Allen
D Ngo
DA Beattie
DA Woods
DA Woods
DA Woods
Emily A. Smith
EW Giesekke
GV Beketov
H Li
H Wang
HJ Simon
J Fahrenfort
J Giergiel
J Langer
JD Swalen
JF Rabolt
JF Rabolt
JFD Liljeblad
JM Bobbitt
JM Bobbitt
JM Bobbitt
Jonathan M. Bobbitt
K Fujiwara
KJ McKee
KJ McKee
KJ McKee
L D'Hooge
L D’Hooge
M Fan
M Fleischmann
M Futamata
M Futamata
M Futamata
M Futamata
M Praveena
M Yoshikawa
MD Lesoine
MD Lesoine
MW Meyer
MW Meyer
NE Schlotter
NE Schlotter
NH Fontaine
NH Fontaine
NJ Harrick
PA Wilks
PA Wilks
PR Greene
Qiaochu Zhu
R Iwamoto
R Iwamoto
R Karl
S Byahut
S Byahut
S-X Huo
SA Meyer
SA Meyer
SP Byahut
T Fujiyama
T Hirschfeld
T Ikeshoji
T Nakanaga
T Shigeyuki
T Takenaka
T Takenaka
W Carius
W Hölzer
W Wittke
WN Hansen
ZS Nickolov
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
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