2 research outputs found
Revisiting faultline conceptualization: measuring faultline strength and distance
- Author
- A.G. Bedeian
- B. Trezzini
- B.F.J. Manly
- C. Gibson
- C.M. Riordan
- D. Lau
- D. Lau
- D.A. Harrison
- D.G. Morrison
- E. Molleman
- Elaine L. Zanutto
- J.B. Shaw
- J.D. Jobson
- J.D. Teachman
- J.E. Sawyer
- J.T. Li
- J.T. Polzer
- K.A. Jehn
- K.A. Jehn
- Karen A. Jehn
- Katerina Bezrukova
- L. Kaufman
- P. Blau
- P.D. Allison
- P.M. Arsenault
- S. Sharma
- S.M.B. Thatcher
- W.R. Dillon
- Publication venue
- Publication date
- Field of study
No full textFaultline measure, Faultline strength, Faultline distance,
Demographic faultlines and creativity in diverse groups
- Author
- A. Edmondson
- A.F. Osborn
- B. Beersma C.K.W. De Dreu
- B. Paulus H.C. Yang
- B.A. Nijstad W. Stroebe
- C. Gibson F. Vermeulen
- C. Nemeth J. Rogers
- C.E. Shalley L.L. Gilson
- C.J. Nemeth
- C.J. Nemeth B.M. Staw
- C.K.W. De Dreu M.A. West
- C.M. Christensen
- D. Abrams M. Wetherell, S. Cochrane, M.A. Hogg, J.C. Turner
- D. Ilgen D. Major, J. Hollenbeck, D. Sego
- D. Lau J.K. Murnighan
- D. Van Knippenberg C.K.W. De Dreu, A.C. Homan
- D.A. Harrison K.H. Price, M.P. Bell
- D.C. Lau K. Murnighan
- D.G. Ancona D.F. Caldwell
- D.G. Myers H. Lamm
- D.H. Gruenfeld
- D.M. Taylor J.R. Doria
- D.R. Brophy
- D.R. Ilgen
- E. Burnstein A. Vinokur
- E. Chell J. Haworth, S. Brearley
- E. Mannix M.A. Neale
- E. Molleman
- E.A. Locke D. Tirnauer, Q. Roberson, B. Goldman, M.E. Latham, E. Weldon
- E.F. Rietzschel B.A. Nijstad, W. Stroebe
- F. Barron D. Harrington
- F.J. Milliken C.A. Bartel, T.R. Kurtzberg
- F.J. Milliken L.L. Martins
- G. Stasser D. Stewart
- H.M. Blalock
- H.W. Crott J. Werner
- I. Simonson B.M. Staw
- I.L. Janis
- I.L. Janis L. Mann
- J. Chatman J. Polzer, S. Barsade, M. Neale
- J. Kasof
- J. Li D.C. Hambrick
- J.A. Goncalo B.M. Staw
- J.B. Shaw
- J.C. Turner P.J. Oakes, A. Haslam, C. McGarty
- J.E. McGrath
- J.E. McGrath
- J.E. Perry-Smith C.E. Shalley
- J.E. Sawyer M.A. Houlette, E.L. Yeagley
- J.S. Lerner P.E. Tetlock
- J.T. Polzer L.P. Milton, W.B. Swann
- K. Williams C. O’Reilly
- K.A. Jehn
- K.A. Jehn G.B. Northcraft, M.A. Neale
- K.M. Eisenhardt L.J. Bougeois
- K.W. Phillips
- K.W. Phillips G. Northcraft, M. Neale
- K.Y. Phillips E.A. Mannix, M.A. Neale, D.H. Gruenfeld
- L. Pelled K. Eisenhardt, K. Xin
- L.M. Camacho P.B. Paulus
- M. Deutsch
- M. Diehl W. Stroebe
- M. Subramaniam M.A. Youndt
- M.B. Brewer
- M.N. Kiggundu
- P. Tolbert A. Andrews, T. Simons
- P.B. Paulus M.T. Dzindolet, G. Poletes, L.M. Camacho
- P.C. Earley E. Mosakowski
- P.E. Tetlock
- P.E. Tetlock
- P.E. Tetlock L. Skitka, R. Boettger
- P.G. Audia J.A. Goncalo
- P.L. McLeod S.A. Lobel, T.H. Cox
- R. Helson
- R. Saavedra P.C. Earley, L. Van Dyne
- R. Wageman
- R.J. Crisp M. Hewstone
- R.J. Ely D.A. Thomas
- S. Moscovici M. Zavalloni
- S.E. Asch
- S.M.B. Thatcher K.A. Jehn, E. Zanutto
- T. Amabile
- T. Cox
- T. Cox S.A. Lobel, P.L. McLeod
- T. Postmes R. Spears, S. Cihangir
- T.M. Amabile
- W. Stroebe M. Diehl, G. Abakoumkin
- W.B. Swann L.P. Milton, J.T. Polzer
- W.B. Swann V.S.Y. Kwan, J.T. Polzer, L.P. Milton
- Publication venue
- 'Elsevier BV'
- Publication date
- 01/01/2008
- Field of study
No full text
