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2 research outputs found

Investigation of Positive and Negative Bias Temperature Instability of High-κ Dielectric Metal Gate Metal–Oxide–Semiconductor-Field-Effect-Transistors by Random Telegraph Signal

Author: A. Asenov
A. Neugroschel
B. Kaczer
E. Cartier
G. L. Rosa
K. Joshi
K. Takeuchi
K. Takeuchi
K. Toni
M. Aoulaiche
M. Cho
M. Toledano-Luque
N. Tega
S. Krishnan
S. Pae
S. Realov
S. A. Krishnan
S. O. Toh
T. Nagumo
Y. Tsukamoto
Publication venue: 'Japan Society of Applied Physics'
Publication date
Field of study

Design for manufacturability and reliability in extreme-scaling VLSI

Author: A B Kahng
A B Kahng
A B Kahng
A B Kahng
A Chakraborty
A Edelsbrunner
A Elayat
A Mallik
A Mallik
A Oosten van
B Chava
B Taylor
B Tudor
B Yu
B Yu
B Yu
B Yu
B Yu
B Yu
B Yu
B Yu
C Kodama
C Z Liu
C Z Liu
C-H Lin
C-Y Liu
D Abercrombie
D Ding
D Ding
D Ding
D G Drmanac
D Z Pan
D-A Li
E Maricau
E Roseboom
E Sahouria
F Oboril
G E Moore
G Posser
H B Zhang
H B Zhang
H B Zhang
H Cho
H T Tian
H T Tian
H T Tian
H T Tian
H Yao
H Yi
H-A Chien
H-A Chien
H-K Peng
H-M Chou
H-S P Wong
I Bita
I H-R Jiang
I-J Liu
J B Zou
J B Zou
J J Ou
J Kim
J Kuang
J Kuang
J Lienig
J Pak
J Pak
J Pak
J X Fang
J Xie
J Y Xu
J-R Gao
J-R Gao
J-S Yang
J-S Yang
J-Y Wuu
K A Campbell
K B Agarwal
K V Aadithya
K Yuan
K Yuan
K Yuan
K-C Wu
K-T Lee
L Capodieci
L Liebmann
L Liebmann
L Pain
M A Lopez
M Cho
M E Sarychev
M Ebrahimi
M Ebrahimi
M Gupta
M Luo
M Luo
M Mirsaeedi
M Mirsaeedi
M Nicolaidis
M Selim
N Ryzhenko
P Gibson
P H Wu
P P Ren
P P Ren
P Reviriengo
P-Y Hsu
Q Ma
R L Orio De
R Reis
R S Wang
R S Wang
R Vattikonda
S Hougardy
S Kiamehr
S Realov
S Roy
S Roy
S Shim
S Shim
S V Kumar
S V Kumar
S Y Hu
S-Y Fang
S-Y Fang
S-Y Fang
S-Y Fang
T C Chen
T C Wang
T Grasser
T Grasser
T Grasser
T Lin
T Matsunawa
W G Sheng
W Gillijns
W L Kang
W Maly
W Ye
W-Y Wen
X D Chen
X Huang
X Ma
X P Tang
X Q Xu
X Q Xu
X Q Xu
X Yang
Y B Lin
Y B Lin
Y Badr
Y Ban
Y L Du
Y L Du
Y L Du
Y L W-S Zhang
Y S Ma
Y S Ma
Y X Ding
Y Xu
Y Xu
Y-H Lin
Y-H Lin
Y-H Lin
Y-T Yu
Y-T Yu
Z G Xiao
Z G Xiao
Z G Xiao
Z Q Liu
Publication venue: 'Springer Science and Business Media LLC'
Publication date
Field of study

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