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1 research outputs found
Fault-based product-line testing: effective sample generation based on feature-diagram mutation
Author
BĂĽrdek Johannes
Kelter Udo
+3Â more
Lochau Malte
Reuling Dennis
Rotärmel Serge
Publication venue
'Association for Computing Machinery (ACM)'
Publication date
01/01/2015
Field of study
No full text
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