Development Flow for On-Line Core Self-Test of Automotive Microcontrollers

Software-Based Self-Test is an effective methodology for devising the on-line testing of Systems-on-Chip. In the automotive field, a set of test programs to be run during mission mode is also called Core Self-Test library. This paper introduces many new contributions: (1) it illustrates the several issues that need to be taken into account when generating test programs for on-line execution; (2) it proposed an overall development flow based on ordered generation of test programs that is minimizing the computational efforts; (3) it is providing guidelines for allowing the coexistence of the Core Self-Test library with the mission application while guaranteeing execution robustness. The proposed methodology has been experimented on a large industrial case study. The coverage level reached after one year of team work is over 87% of stuck-at fault coverage, and execution time is compliant with the ISO26262 specification. Experimental results suggest that alternative approaches may request excessive evaluation time thus making the generation flow unfeasible for large designs

Focus on soluble salts transport phenomena: the study case of Leonardo monochrome at Sala delle Asse (Milan)

The program of investigations on “Sala delle Asse”, which hosts a monochrome landscape attributed to Leo-nardo, in the Sforza Castle in Milan recently concluded the first step. Results of the analytical tests for the characterization of materials and their damages showed the high diffu-sion and concentration of nitrates and sulphates on the surface of the monochrome at the edge with the resto-ration mortars, on the right side of the north-western wall. On the base of the scientific literature and labora-tory tests, the researchers identified a threshold of RH above which deliquescence of salts could easily occur. Microclimatic monitoring results informed that during the most humid days in spring, summer and fall, RH trespasses this threshold, with a frequency of about 30 events/year. After an accurate analysis of air Tempera-ture (T°C) and Relative Humidity (RH) resulted that the exterior changes especially affect the interior climate at some summer conditions

Nitrogen-Doped Carbon Quantum Dots for Biosensing Applications: The Effect of the Thermal Treatments on Electrochemical and Optical Properties

The knowledge of the ways in which post-synthesis treatments may influence the properties of carbon quantum dots (CDs) is of paramount importance for their employment in biosensors. It enables the definition of the mechanism of sensing, which is essential for the application of the suited design strategy of the device. In the present work, we studied the ways in which post-synthesis thermal treatments influence the optical and electrochemical properties of Nitrogen-doped CDs (N-CDs). Blue-emitting, N-CDs for application in biosensors were synthesized through the hydrothermal route, starting from citric acid and urea as bio-synthesizable and low-cost precursors. The CDs samples were thermally post-treated and then characterized through a combination of spectroscopic, structural, and electrochemical techniques. We observed that the post-synthesis thermal treatments show an oxidative effect on CDs graphitic N-atoms. They cause their partially oxidation with the formation of mixed valence state systems, [CDs]0+, which could be further oxidized into the graphitic N-oxide forms. We also observed that thermal treatments cause the decomposition of the CDs external ammonium ions into ammonia and protons, which protonate their pyridinic N-atoms. Photoluminescence (PL) emission is quenched

Long‐term outcome of alcohol withdrawal seizures

Background and purpose Alcohol withdrawal seizures (AWS) are a well‐known complication of chronic alcohol abuse, but there is currently little knowledge of their long‐term relapse rate and prognosis. The aims of this study were to identify risk factors for AWS recurrence and to study the overall outcome of patients after AWS. Methods In this retrospective single‐center study, we included patients who were admitted to the Emergency Department after an AWS between January 1, 2013 and August 10, 2021 and for whom an electroencephalogram (EEG) was requested. AWS relapses up until April 29, 2022 were researched. We compared history, treatment with benzodiazepines or antiseizure medications (ASMs), laboratory, EEG and computed tomography findings between patients with AWS relapse (r‐AWS) and patients with no AWS relapse (nr‐AWS). Results A total of 199 patients were enrolled (mean age 53 ± 12 years; 78.9% men). AWS relapses occurred in 11% of patients, after a median time of 470.5 days. Brain computed tomography ( n = 182) showed pathological findings in 35.7%. Risk factors for relapses were history of previous AWS ( p = 0.013), skull fractures ( p = 0.004) at the index AWS, and possibly epileptiform EEG abnormalities ( p = 0.07). Benzodiazepines or other ASMs, taken before or after the index event, did not differ between the r‐AWS and the nr‐AWS group. The mortality rate was 2.9%/year of follow‐up, which was 13 times higher compared to the general population. Risk factors for death were history of AWS ( p &lt; 0.001) and encephalopathic EEG ( p = 0.043). Conclusions Delayed AWS relapses occur in 11% of patients and are associated with risk factors (previous AWS &gt;24 h apart, skull fractures, and pathological EEG findings) that also increase the epilepsy risk, that is, predisposition for seizures, if not treated. Future prospective studies are mandatory to determine appropriate long‐term diagnostic and therapeutic strategies, in order to reduce the risk of relapse and mortality associated with AWS.</p

Software-Based Self-Test Techniques for Dual-Issue Embedded Processors

Nowadays, Self-Test strategies for testing embedded processors are increasingly diffused, especially for safety critical systems. Test programs can be effectively used for this purpose. This paper describes a set of systematic self-test techniques for in-order dual-issue embedded processors. The paper shows how to produce test programs suitable for the detection of faults in five classes of sub-modules: duplicated computational modules; multi-port register file; duplicated pipeline registers and feed-forward paths; pipeline interlocking logic; and pre-fetch buffer. While some techniques extend single-issue test programs, new techniques are also shown; results are illustrated for a couple of 32-bit in-order dual-issue processors included in automotive Systems-on-Chip manufactured by STMicroelectronics

Software-Based Self-Test Techniques for Dual-Issue Embedded Processors

Nowadays, Self-Test strategies for testing embedded processors are increasingly diffused, especially for safety critical systems. Test programs can be effectively used for this purpose. This paper describes a set of systematic self-test techniques for in-order dual-issue embedded processors. The paper shows how to produce test programs suitable for the detection of faults in five classes of sub-modules: duplicated computational modules; multi-port register file; duplicated pipeline registers and feed-forward paths; pipeline interlocking logic; and pre-fetch buffer. While some techniques extend single-issue test programs, new techniques are also shown; results are illustrated for a couple of 32-bit in-order dual-issue processors included in automotive Systems-on-Chip manufactured by STMicroelectronics

Software-based self-test techniques of computational modules in dual issue embedded processors

Self-Test strategies for testing embedded processors are increasingly diffused. In this paper, we describe a set of self-test techniques tackling dual issue embedded processors. The paper details how to produce test programs suitable to detect stuck-at faults in computational modules belonging to dual issue processors. The proposed technique is aimed at extending single issue test programs; results are illustrated for a 32-bit processor included in an automotive System-on-Chip manufactured by STMicroelectronics and implementing a dual issue strategy with static dispatch of instructions