Fault-Independent Test-Generation for Software-Based Self-Testing

Software-based self-test (SBST) is being widely used in both manufacturing and in-the-field testing of processor-based devices and Systems-on-Chips. Unfortunately, the stuck-at fault model is increasingly inadequate to match the new and different types of defects in the most recent semiconductor technologies, while the explicit and separate targeting of every fault model in SBST is cumbersome due to the high complexity of the test-generation process, the lack of automation tools, and the high CPU-intensity of the fault-simulation process. Moreover, defects in advanced semiconductor technologies are not always covered by the most commonly used fault-models, and the probability of defect-escapes increases even more. To overcome these shortcomings we propose the first fault-independent SBST method. The proposed method is almost fully automated, it offers high coverage of non-modeled faults by means of a novel SBST-oriented probabilistic metric, and it is very fast as it omits the time-consuming test-generation/fault-simulation processes. Extensive experiments on the OpenRISC OR1200 processor show the advantages of the proposed method

Fault-Independent Test-Generation for Software-Based Self-Testing

Software-based self-test (SBST) is being widely used in both manufacturing and in-the-field testing of processor-based devices and Systems-on-Chips. Unfortunately, the stuck-at fault model is increasingly inadequate to match the new and different types of defects in the most recent semiconductor technologies, while the explicit and separate targeting of every fault model in SBST is cumbersome due to the high complexity of the test-generation process, the lack of automation tools, and the high CPU-intensity of the fault-simulation process. Moreover, defects in advanced semiconductor technologies are not always covered by the most commonly used fault-models, and the probability of defect-escapes increases even more. To overcome these shortcomings we propose the first fault-independent SBST method. The proposed method is almost fully automated, it offers high coverage of non-modeled faults by means of a novel SBST-oriented probabilistic metric, and it is very fast as it omits the time-consuming test-generation/fault-simulation processes. Extensive experiments on the OpenRISC OR1200 processor show the advantages of the proposed method

An extended model to support detailed GPGPU reliability analysis

General Purpose Graphics Processing Units (GPGPUs) have been used in the last decades as accelerators in high demanding data processing applications, such as multimedia processing and high-performance computing. Nowadays, these devices are becoming popular even in safety-critical applications, such as autonomous and semi-autonomous vehicles. However, these devices can suffer from the effects of transient faults, such as those produced by radiation effects. These effects can be represented in the system as Single Event Upsets (SEUs) and are able to generate intolerable application misbehaviors in safety critical environments. In this work, we extended the capabilities of an open-source VHDL GPGPU model (FlexGrip) in order to study and analyze in a much more detailed manner the effects of SEUs in some critical modules within a GPGPU. Simulation results showed that scheduler controller has different levels of SEU sensibility depending on the affected location. Moreover, a reduced number of execution units, in the GPGPU can decrease the system reliability

An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells

This paper compares different types of resistive defects that may occur inside low-power SRAM cells, focusing on their impact on device operation. Notwithstanding the continuous evolution of SRAM device integration, manufacturing processes continue to be very sensitive to production faults, giving rise to defects that can be modeled as resistances, especially for devices designed to work in low-power modes. This work analyzes this type of resistive defect that may impair the device functionalities in subtle ways, depending on the defect characteristics and values that may not be directly or easily detectable by traditional test methods. We analyze each defect in terms of the possible effects inside the SRAM cell, its impact on power consumption, and provide guidelines for selecting the best test methods

REFU: Redundant Execution with Idle Functional Units, Fault Tolerant GPGPU architecture

The General-Purpose Graphics Processing Units (GPGPU) with energy efficient execution are increasingly used in wide range of applications due to high performance. These GPGPUs are fabricated with the cutting-edge technologies. Shrinking transistor feature size and aggressive voltage scaling has increased the susceptibility of devices to intrinsic and extrinsic noise leading to major reliability issues in the form of the transient faults. Therefore, it is essential to ensure the reliable operation of the GPGPUs in the presence of the transient faults. GPGPUs are designed for high throughput and execute the multiple threads in parallel, that brings a new challenge for the fault detection with minimum overheads across all threads. This paper proposes a new fault detection method called REFU, an architectural solution to detect the transient faults by temporal redundant re-execution of instructions using the idle functional execution units of the GPGPU. The performance of the REFU is evaluated with standard benchmarks, for fault free run across different workloads REFU shows mean performance overhead of 2%, average power overhead of 6%, and peak power overhead of 10%

Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks

The current demands for autonomous driving generated momentum for an increase in research in the different technologies required for these applications. Nonetheless, the limited access to representative designs and industrial methodologies poses a challenge to the research community. Considering this scenario, there is a high demand for an open-source solution that could support development of research targeting automotive applications. This paper presents the current status of AutoSoC, an automotive SoC benchmark suite that includes hardware and software elements and is entirely open-source. The objective is to provide researchers with an industrial-grade automotive SoC that includes all essential components, is fully customizable, and enables analysis of functional safety solutions and automotive SoC configurations. This paper describes the available configurations of the benchmark including an initial assessment for ASIL B to D configurations

Recent Trends and Perspectives on Defect-Oriented Testing

Electronics employed in modern safety-critical systems require severe qualification during the manufacturing process and in the field, to prevent fault effects from manifesting themselves as critical failures during mission operations. Traditional fault models are not sufficient anymore to guarantee the required quality levels for chips utilized in mission-critical applications. The research community and industry have been investigating new test approaches such as device-aware test, cell-aware test, path-delay test, and even test methodologies based on the analysis of manufacturing data to move the scope from OPPM to OPPB. This special session presents four contributions, from academic researchers and industry professionals, to enable better chip quality. We present results on various activities towards this objective, including device-aware test, software-based self-test, and memory test

Analysis of the effects of soft errors on compression algorithms through fault injection inside program variables

Data logging applications, such as those deployed in satellite launchers to acquire telemetry data, may require compression algorithms to cope with large amounts of data as well as limited storage and communication capabilities. When commercial-off-the-shelf hardware components are used to implement such applications, radiation-induced soft errors may occur, especially during the last stages of the launcher cruise, potentially affecting the algorithm execution. The purpose of this work is to analyze two compression algorithms using fault injection to evaluate their robustness against soft errors. The main contribution of the work is the analysis of the compression algorithm susceptibility by attacking their data structures (also referred as program variables) rather than the memory elements of the computing platform in charge of the algorithm execution. This approach is agnostic of the downstream implementation details. Instead, the intrinsic robustness of compression algorithms can be evaluated quickly, and system-level decisions can be taken before the computing platform is finalize