X-RAY DIFFRACTOMETRY OF REAL STRUCTURE IN MONOCRYSTALS AND EPITAXIAL LAYERS ON BASE OF TWO-DIMENSIONAL INTENSITY ANALYSIS

The diffraction of the monocrystals in the surface layers with depth-changing deformation has been investigated, and the modelling programs of the Bragg reflection curves have been created; the dynamic effects in the diffusion scattering have been discovered and studied; the general conception of the two-dimensional diffraction analysis in the relaxated and coherent multi-layer epitaxial systems has been developed. The influence of the different type structural breakdowns in the monocrystals and epitaxial layers on the two-dimensional picture of the diffraction has been studied, and the methods for identification of the defects have been developed. The deformation distribution profiles over depth of the ion-alloyed layers have been obtained firstly. The complex diffraction analysis of the structural improvement in the superconducting films YBaCuO has been performed.Available from VNTIC / VNTIC - Scientific & Technical Information Centre of RussiaSIGLERURussian Federatio