The ALOISA end station at Elettra: a novel multicoincidence spectrometer for angle resolved APECS

Coincidence measurements have been extensively performed in atomic and molecular physics since early 1970s. To apply this methodology to solids and surfaces has been a major target since early days, but the long average time needed to complete a coincidence experiment has hampered its attainment. In particular the coincidence technique has not been yet applied in an angle resolved way such for studying the momentum correlation in the ejection of electron pairs from solid surfaces. The experimental chamber at the ALOISA beamline at Elettra. by means of a set of seven homemade electron analyzers, is the first apparatus able to perform Angle Resolved - Auger Photoelectron Coincidence Spectroscopy (AR-APECS) from solid surfaces. In the typical setup ten different pairs of coincident electrons can be measured simultaneously, so reducing the acquisition time by one order of magnitude

The ALOISA end station at Elettra: a novel multicoincidence spectrometer for angle resolved APECS RID C-5199-2010 RID G-7348-2011

Coincidence measurements have been extensively performed in atomic and molecular physics since early 1970s. To apply this methodology to solids and surfaces has been a major target since early days, but the long average time needed to complete a coincidence experiment has hampered its attainment. In particular the coincidence technique has not been yet applied in an angle resolved way such for studying the momentum correlation in the ejection of electron pairs from solid surfaces. The experimental chamber at the ALOISA beamline at Elettra. by means of a set of seven homemade electron analyzers, is the first apparatus able to perform Angle Resolved - Auger Photoelectron Coincidence Spectroscopy (AR-APECS) from solid surfaces. In the typical setup ten different pairs of coincident electrons can be measured simultaneously, so reducing the acquisition time by one order of magnitude. (C) 2001 Elsevier Science B.V. All rights reserved

Copper-phthalocyanine induced reconstruction of Au(110)

The structure of ultrathin Cu-phthalocyanine (Cu-Pc) film on Au(110) has been studied by means of several diffraction tecniques: helium atom scattering (HAS), low energy electron diffraction (LEED) and grazing incidence X-ray diffraction (GIXD). HAS has been used to measure the long range order of the organic overlayer, whereas LEED at 200 eV has been used to probe the corresponding substrate reconstruction. At the monolayer coverage, the Au(110) substrate displays a reconstruction with a 3-fold periodicity along the [001] direction, whose structure has been studied by out of plane GIXD and variable polarization X-ray absorption near edge spectroscopy (XANES). We found the structure of the substrate unit cell to be an asymmetric shallow (1 x 3) reconstruction with the Cu-Pc molecules tilted by an angle of similar to32degrees from the (110) surface plane

The ALOISA end station at Elettra: a novel multicoincidence spectrometer for angle resolved APECS

Coincidence measurements have been extensively performed in atomic and molecular physics since early 1970s. To apply this methodology to solids and surfaces has been a major target since early days, but the long average time needed to complete a coincidence experiment has hampered its attainment. In particular the coincidence technique has not been yet applied in an angle resolved way such for studying the momentum correlation in the ejection of electron pairs from solid surfaces. The experimental chamber at the ALOISA beamline at Elettra. by means of a set of seven homemade electron analyzers, is the first apparatus able to perform Angle Resolved - Auger Photoelectron Coincidence Spectroscopy (AR-APECS) from solid surfaces. In the typical setup ten different pairs of coincident electrons can be measured simultaneously, so reducing the acquisition time by one order of magnitude. (C) 2001 Elsevier Science B.V. All rights reserved

Periodic arrays of Cu-Phthalocyanine chains on Au(110

The structure of ultrathin Cu-phthalocyanine (Cu-Pc) films on the (1 x 2)-Au(I 10) surface has been studied. The overlayer deposition has been monitored in real time by helium atom scattering (HAS) and low energy electron diffraction (LEED). Throughout the monolayer regime the Cu-Pc molecules are systematically observed to line-up edge-to-edge along the [110] direction of the Au substrate, yielding a commensurate 5-fold periodicity (14.4 angstrom). Cu-Pc chains deconstruct the 2-fold Au missing row order in the early stage of deposition. A set of higher order periodicities (5-, 7-, and 3-fold) are progressively observed along [001] with increasing CuPc deposition, the 3-fold phase appearing at the monolayer saturation coverage. The corresponding molecular orientation has been studied by variable polarization absorption spectroscopy (XAS), whereas the Au substrate structure has been determined by out-of-plane surface X-ray diffraction. The (5 x 5) phase is found to be rather corrugated, and it exhibits a high degree of long-range order yielding the most prominent diffraction pattern. In the (5 x 5) phase, the Cu-Pc chains are found to lift the underneath missing row reconstruction, being separated by residual Au rows. Similarly, in the more compressed 3-fold monolayer phase, the Cu-Pc molecules were formerly found to lie within a shallow (1 x 3) An reconstruction [Cossaro, A.; et al. J. Phys. Chem. B 2004, 108, 14671]. From comparison of the different deposition stages, as measured in real time by HAS, we can draw a comprehensive picture of the system evolution. In fact, the observed periodicities at different coverage are always formed by an array of Cu-Pc chains in shallow troughs that are equally spaced by a number of uncovered Au rows, as dictated by the Cu-Pc coverage. The growth of Cu-Pc arrays in the submonolayer range is thus driven by an interchain repulsion mechanism

Copper-phthalocyanine induced reconstruction of Au(110)

The structure of ultrathin Cu-phthalocyanine (Cu-Pc) film on Au(110) has been studied by means of several diffraction tecniques: helium atom scattering (HAS), low energy electron diffraction (LEED) and grazing incidence X-ray diffraction (GIXD). HAS has been used to measure the long range order of the organic overlayer, whereas LEED at 200 eV has been used to probe the corresponding substrate reconstruction. At the monolayer coverage, the Au(110) substrate displays a reconstruction with a 3-fold periodicity along the [001] direction, whose structure has been studied by out of plane GIXD and variable polarization X-ray absorption near edge spectroscopy (XANES). We found the structure of the substrate unit cell to be an asymmetric shallow (1 x 3) reconstruction with the Cu-Pc molecules tilted by an angle of similar to32degrees from the (110) surface plane

Periodic arrays of Cu-phthalocyanine chains on Au(110)

The structure of ultrathin Cu-phthalocyanine (Cu-Pc) films on the (1 x 2)-Au(I 10) surface has been studied. The overlayer deposition has been monitored in real time by helium atom scattering (HAS) and low energy electron diffraction (LEED). Throughout the monolayer regime the Cu-Pc molecules are systematically observed to line-up edge-to-edge along the [110] direction of the Au substrate, yielding a commensurate 5-fold periodicity (14.4 angstrom). Cu-Pc chains deconstruct the 2-fold Au missing row order in the early stage of deposition. A set of higher order periodicities (5-, 7-, and 3-fold) are progressively observed along [001] with increasing CuPc deposition, the 3-fold phase appearing at the monolayer saturation coverage. The corresponding molecular orientation has been studied by variable polarization absorption spectroscopy (XAS), whereas the Au substrate structure has been determined by out-of-plane surface X-ray diffraction. The (5 x 5) phase is found to be rather corrugated, and it exhibits a high degree of long-range order yielding the most prominent diffraction pattern. In the (5 x 5) phase, the Cu-Pc chains are found to lift the underneath missing row reconstruction, being separated by residual Au rows. Similarly, in the more compressed 3-fold monolayer phase, the Cu-Pc molecules were formerly found to lie within a shallow (1 x 3) An reconstruction [Cossaro, A.; et al. J. Phys. Chem. B 2004, 108, 14671]. From comparison of the different deposition stages, as measured in real time by HAS, we can draw a comprehensive picture of the system evolution. In fact, the observed periodicities at different coverage are always formed by an array of Cu-Pc chains in shallow troughs that are equally spaced by a number of uncovered Au rows, as dictated by the Cu-Pc coverage. The growth of Cu-Pc arrays in the submonolayer range is thus driven by an interchain repulsion mechanism

Electronic states of CuPc chains on the Au(110) surface

The electronic properties of Cu-phthalocyanine (CuPc) molecules flat lying along the channels of the Au(110) reconstructed surface have been investigated by means of ultraviolet and x-ray photoelectron spectroscopy. The ordered chains give rise to a highly ordered single-layer structure with a (5x3) symmetry. Although from the core-level analysis not any significant charge transfer between the molecules and the underlying Au surface is observed, the valence band photoemission data bring to light CuPc-induced features localized at the interface. In particular, energy versus momentum dispersion of an interface state reveals a bandwidth of about 90 meV along the enlarged Au channels, where the CuPc chains are formed, with a defined fivefold symmetry well fitting the CuPc intermolecular distance

Emission-depth-selective Auger photoelectron coincidence spectroscopy

The collision statistics of the energy dissipation of Auger and photoelectrons emitted from an amorphized Si(100) surface is studied by measuring the Si 2p photoelectron line as well as the first plasmon loss peak in coincidence with the Si-LVV Auger transition and the associated first plasmon loss. The Si 2p plasmon intensity decreases when measured in coincidence with the Si-LVV peak. If measured in coincidence with the Si-LVV plasmon the decrease is significantly smaller. The results agree quantitatively with calculations accounting for surface, volume, and intrinsic losses as well as elastic scattering in a random medium. In this way one can determine the average emission depth of individual electrons by means of Auger photoelectron coincidence spectroscopy, which therefore constitutes a unique tool to investigate interfaces at the nanoscale level

Emission-depth-selective Auger photoelectron coincidence spectroscopy

The collision statistics of the energy dissipation of Auger and photoelectrons emitted from an amorphized Si(100) surface is studied by measuring the Si 2p photoelectron line as well as the first plasmon loss peak in coincidence with the Si-LVV Auger transition and the associated first plasmon loss. The Si 2p plasmon intensity decreases when measured in coincidence with the Si-LVV peak. If measured in coincidence with the Si-LVV plasmon the decrease is significantly smaller. The results agree quantitatively with calculations accounting for surface, volume, and intrinsic losses as well as elastic scattering in a random medium. In this way one can determine the average emission depth of individual electrons by means of Auger photoelectron coincidence spectroscopy, which therefore constitutes a unique tool to investigate interfaces at the nanoscale level