REFLECTION SAXS INVESTIGATION OF AMORPHOUS THIN FILMS

The present work points out the advantages of a reflection variant of small-angle X-ray scattering(RSAXS) in the study of amorphous thin films.The method is applied to amorphous Mox(a-Ge)1-x films (0.07≤x≥0.32), allowing the determination of the size distribution and magnitude of the compositional fluctuations

Mo - MODIFIED AMORPHOUS Ge : ELECTRICAL TRANSPORT AND STRUCTURE

The electrical resistivity, elastoresistivity and structure measurements on Mo-modified amorphous Ge films MoxGe1-x (0.01≤x≤0.48) show that increasing the metal concentration gradually modifies the semiconducting character and covalent bonding, characteristic for a-Ge, towrds a more metallic bonding type

Metal clusters in metal/C

Structure of metal clusters and of the C60 matrix in Au/C60 and Cu/C60 nanosystems was investigated by X-ray diffraction. Results support a charge-transfer-type interaction at the metal-C60 interface, which affects the size distribution of metal clusters, favouring interstitial location of metal ions in the fullerite lattice

Hydrogen storage in icosahedral and related phases of rapidly solidified Ti-Zr-Ni alloys

High-resolution synchrotron-radiation powder diffraction experiments were performed to observe structural changes induced by hydrogen loading in rapidly-quenched Ti-Zr-Ni alloy ribbons with dominant icosahedral character. Lattice expansion effects due to hydrogen storage in Ti-Zr-Ni quasicrystals as well as phonon and phason disorder coefficients are obtained from an analysis of diffraction linewidths