1 research outputs found
Gitterdefekt-Abbildung durch elektronenmikroskopischen Beugungskontrast
- Author
- A Art
- A Fourdeaux
- A Howie
- AF Ashby
- AJ Ardell
- AJ Morton
- AK Head
- AK Head
- AK Head
- AK Head
- AK Head
- AR Thölen
- AR Thölen
- CJ Humphreys
- CJ Humphreys
- CT Forwood
- D Lepski
- D Lepski
- D Schulze
- DJ Dingley
- F D’aragona
- F Seitz
- G Radi
- G Remaut
- G Thomas
- GE Hollox
- GH Smith
- GW Groves
- H Blank
- H Blank
- H Diepers
- H Hashimoto
- H Hashimoto
- H Wondratschek
- J Landuyt Van
- J Landuyt Van
- J Landuyt Van
- J Landuyt Van
- J Landuyt Van
- JD Eshelby
- JW Edington
- JW Steeds
- K Borgreen
- K Scheerschmidt
- K Scheerschmidt
- K Scheerschmidt
- K Scheerschmidt
- K Scheerschmidt
- KP Chik
- KP Chik
- KW Andrews
- LC France
- LM Clarebrough
- M Guymont
- M Pasemann
- M Rühle
- M Rühle
- M Wilkens
- MJ Marcinkovski
- MJ Whelan
- MJ Whelan
- N Broom
- O Johari
- P Delavignette
- P Humble
- P Humble
- P Humble
- P Skalicky
- P Skalicky
- PA Doyle
- PB Hirsch
- PB Hirsch
- PM Kelly
- R Bullough
- R Geyers
- R Geyers
- R Geyers
- R Geyers
- R Gleichmann
- R Sandström
- R Sandström
- R Serneels
- RC Mcdonald
- S Amelinckx
- S Amelinckx
- S Cheerschmidt
- T Yamamoto
- V Häussermann
- V Laue
- VA Phillips
- W Bollmann
- WJ Tunstall
- WJ Tunstall
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- 01/01/1982
- Field of study
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