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Energy-storage properties and electrocaloric effects of Pb(1-3x/2)LaxZr0.85Ti0.15O3 antiferroelectric thick films
1-µm-Pb(1-3x/2)LaxZr0.85Ti0.15O3 (PLZT) antiferroelectric (AFE) thick films with x = 0.08,
0.10, 0.12, and 0.14 were deposited on LaNiO3/Si (100) substrates by a sol-gel method. The
dielectric properties, energy-storage performance, electrocaloric effect, and leakage current behavior
were investigated in detail. With increasing La content, dielectric constant and saturated polarizations
of the thick films were gradually decreased. A maximum recoverable energy-storage density of 38
J/cm3 and efficiency of 71% were achieved in the thick films with x = 0.12 at room temperature.
Moreover, a large reversible adiabatic temperature change ∆T = 25.0
o
C was presented in the thick
films with x = 0.08 at 127
o
C at 990 kV/cm. All the samples had a lower leakage current density
below 10-
6
A/cm2 at room temperature. These results indicated that the PLZT AFE thick films could
be a potential candidate for applications in high energy-storage density capacitors and cooling
devices
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