39 research outputs found
An Anatomy of Satirical Cartoons in Contemporary Vietnam: Political Communication and Representations of Systemic Corruption in a One-party State
Satirical cartooning in Vietnam is subject to a complex dynamic: an increasingly liberalised and internationalised economy, and the rise of social media in a one-party state. This article examines what state-sanctioned satirical cartoons can reveal about the representation and management of political criticism in such a context. We find a growing trend of depicting corruption as a systemic problem, which is present in 45 per cent of the sample and in 70 per cent of the 20 most-viral cartoons in one of Vietnam’s most popular magazines, Tuoi Tre Cuoi (Youth Humour). This trend can be interpreted as a change in the sensibility of audiences and a shift toward a more tolerant media landscape. The trend, however, may also be a worrying sign of the dual dangers of cynicism in Vietnamese politics: the development of apathy among audiences and the cynical use of art by authorities. Despite these concerns, we argue, political cartoons in Vietnam provide an important public avenue for collective political reflection and everyday social solidarity
Swing Ratios and Ensemble Timing in Jazz Performance: Evidence for a Common Rhythmic Pattern
Characterization of linewidth variation on 248- and 193-nm exposure tools
Proceedings of S P I E - the International Society for OpticalThe line-width variation of a 193 nm lithographic process utilizing a 0.60 NA scanner and a binary reticle is compared to that
of a 248 nm lithographic processes utilizing a 0.68 NA scanner and a variety of reticle technologies. These include binary,
attenuated PSM with assist features and alternating PSM reticles. Despite the fact that the 193 nm tool has a lower NA and
that the data was generated using a binary reticle, the 193 nm lithographic process allows for the line-width values to be
pushed lower than previously achieved with 248 nm lithographic processes. The 3-sigma values from 4000 electrical linewidth
measurements per wafer (160 measurements per 25*25 mm field, 25 fields per wafer) were calculated for different
mask features. The 193 nm process was capable of reaching line-widths needed for future generations of advance logic
chips. Compared to the 193 nm process utilizing a binary reticle, only the 248 nm processes utilizing either an attenuated
PSM with assist features or an alternating PSM reticle had similarly low line-width variation. The 248 nm processes utilizing
a binary reticle had higher line-width variation even at larger poly gate conductor line-widths.published_or_final_versio
Internationalization and Cultural Diversity in Higher Education : Teaching for Mutual Understanding
Mapping the musical commons: Digitization, simulation, speculation
This essay is a speculation on how recent digitization and simulation technologies are providing a means of mapping cultural processes that may contribute to new ways of enclosing the musical commons. Three broad, shifting, and interwoven themes permeate this speculation: contested concepts of ownership between a disorganized and reorganized capitalism; blurred distinctions between cultural products and human processes; living beings between the convergence of technologies for mapping and simulation. By outlining a potential paradigm shift in how people understand music, the essay suggests some new directions for ownership and control of primary cultural resources, especially with respect to embodied and simulated musical processes