Mapping QTL for bruchid resistance in rice bean (Vigna umbellata)

This research articles was published in Euphytica journal, volume 207, 2016The damage caused to stored seed by bruchids (Callosobruchus maculatus) is considered to be a major production constraint in rice bean (Vigna umbellata). Breeding for genetically determined resistance is the most environmentally benign and cost-effective means to mitigate the losses to bruchid infestation. Here, a screen of rice bean germplasm identified two sources of resistance, and determined the genetic basis of the resistance using a quantitative trait locus (QTL) mapping approach. The two resistant accessions (LRB238 and JP100304) were each crossed to a common susceptible cultivar (LRB26) to generate F2 mapping populations, one of which (LRB238 × LRB26) was genotyped with a range of Vigna sp. microsatellite assays and by sequence related amplified polymorphism (SRAP) fingerprinting. The resulting linkage map comprised ten linkage groups and covered a genetic distance of 872.1 cM with a mean inter-marker distance of 32.05 cM. The subsequent QTL analysis detected the presence of 11 QTL, distributed over all ten linkage groups, most of which were associated with the % damage caused to the seed. Two major QTL, Cmpd1.5 (flanked by the SRAP markers E2M9-270 and E12M7-311) and Cmpd1.6 (flanked by the SRAP marker E7M10-141 and the microsatellite locus CEDG259) mapped within 11.9 cM and 13.0 cM of the flanking markers, respectively, accounted for, 67.3 and 77.4 % of the variance respectively, for % damaged seeds. A bulked segregation analysis carried out in the JP100304 × LRB26 population revealed that the resistance donor harboured some resistance factors not represented in LRB238

Recent Development of Nanomaterial-Doped Conductive Polymers

© 2017, The Minerals, Metals & Materials Society. Conductive polymers (CPs) have received significant research attention in material engineering for applications in microelectronics, micro-scale sensors, electromagnetic shielding, and micro actuators. Numerous research efforts have been focused on enhancing the conductivity of CPs by doping. Various conductive materials, such as metal nanoparticles and carbon-based nanoparticles, and structures, such as silver nanoparticles and graphene nanosheets, have been converted into polypyrrole and polypyrrole compounds as the precursors to developing hybrids, conjugates, or crystal nodes within the matrix to enhance the various structural properties, particularly the electrical conductivity. This article reviews nanomaterial doping of conductive polymers alongside technological advancements in the development and application of nanomaterial-doped polymeric systems. Emphasis is given to conductive nanomaterials such as nano-silver particles and carbon-based nanoparticles, graphene nano-sheets, fullerene, and carbon nanotubes (CNT) as dopants for polypyrrole-based CPs. The nature of induced electrical properties including electromagnetic absorption, electrical capacitance, and conductivities of polypyrrole systems is also discussed. The prospects and challenges associated with the development and application of CPs are also presented