2 research outputs found
Raman Fingerprint of Aligned Graphene/h-BN Superlattices
- Author
- Alexander S. Mayorov
- Andre K. Geim
- Axel Eckmann
- Berciaud S.
- Brey L.
- Campos-Delgado J.
- Cancado L. G.
- Carozo V.
- Carozo V.
- Cinzia Casiraghi
- Daniel Elias
- Dean C. R.
- Eckmann A.
- Eckmann A.
- Ferrari A. C.
- Ferreira E. H. M.
- Forster F.
- Geliang Yu
- Gupta A. K.
- Havener R. W.
- Huafeng Yang
- Jaesung Park
- Kim K.
- Kittel C.
- Kostya S. Novoselov
- Michele Lazzeri
- Moldt T.
- Ni Z.
- Ni Z.
- Park C.-H.
- Park C.-H.
- Pocharal P.
- Ponomarenko L. A.
- Rashid Jalil
- Righi A.
- Roman V. Gorbachev
- Tsu R.
- Venezuela P.
- Wallbank J. R.
- Yankowitz M.
- Publication venue
- 'American Chemical Society (ACS)'
- Publication date
- Field of study
Nanostructured Materials Based Next Generation Devices and Sensors
- Author
- A. Bachtold
- A. Erdem
- A. Fonesca
- A. Garg
- A. Javey
- A. Vaseashta
- A.N. Goldestien
- C. Berger
- C. Dwyer
- C. Emmenegger
- C. Journet
- C.K. Poa
- D. Brenner
- D. Dimova-Malinovska
- D. Shrivastava
- D. Warheit
- D.M. Gruen
- D.M. Gruen
- G. Prio
- G.A. Rand
- H. Dai
- H. Sugie
- H.W. Postma
- I. Brodie
- J. M. Kinaret
- J. Wang
- J. Zhao
- J.H. Hafner
- J.M. Bonrad
- K. Jiang
- K. Kempa
- K. Keren
- K. Millan
- L. Leoni
- L. Leoni
- L. Rotkina
- M. Bockrath
- M. Zheng
- M.J. Sailor
- M.J. Sailor
- M.S. Fuhrer
- M.S. Shaffer
- M.S.P. Shafer
- N. S. Lee
- N. Sano
- O.M. Kuttel
- P. Braun
- P. Buffat
- P. Kim
- P. Pocharal
- P.G. Collins
- P.J.F. Harris
- P.W. Anderson
- R. C. Mani
- R. Chen
- R. Schlittler
- R.H. Baughman
- R.J. Chen
- R.Y.C. Kong
- S. Fan
- S. G. Louie
- S. Link
- S. Sotiropoulou
- S. Sotiropoulou
- S. Wang
- S.J. Tans
- S.J. Tans
- S.J.V. Frankland
- T. Gou
- T. Muhl
- T. Sharda
- T.M. Shaw
- T.N. Le
- V. Lordi
- V. Podolskiy
- W. Apel
- W. Liang
- W. Liang
- X. Gao
- X.H. Gao
- X.H. Gao
- Y. Champion
- Y. Cheng
- Y. Gao
- Y. Le
- Y. Saito
- Y. Zhao
- Y.M. Wong
- Publication venue
- 'Springer Science and Business Media LLC'
- Publication date
- 01/01/2005
- Field of study