Valence Band Onset and Valence Plasmons of SnO2 and In2-xSnx O3 Thin Films

Valence band onset (Ev), valence band tail (VBT) and valence plasmons (VPs) have been studied as a function of sputtering of SnO2 and In2-xSnxO3 (ITO) thin films, using ultraviolet photoemission spectroscopy (UPS). Decrease in Ev with respect to the Fermi level and increase in the density of energy levels of VBT have been observed after 5 minutes of sputtering using Ar+ ions (500V). Bulk and surface components of VPs of Sn, SnO and SnO2 in sputtered SnO2 thin films have been observed in UPS spectra. Similarly, bulk and surface components of VPs of In, Sn and oxygen deficient ITO in sputtered ITO thin films have been observed in UPS spectra. Possible roles of Ev and increase in the density of energy levels of VBT are discussed in the mechanisms of current transport through heterojunctions of SnO2 with semiconductors.Comment: To be published (2014

In situ soft x-ray absorption spectroscopic study of Fe/MgO interfaces

Interfacial reaction between iron and MgO has been studied in situ during deposition of iron on MgO surface, using soft x-ray absorption spectroscopy. High sensitivity of the technique which is capable of detecting even a sub monolayer of a given phase, combined with in situ measurements as a function of iron layer thickness, allowed one to make a quantitative estimate of interfacial phases. Two different substrates namely, MgO (001) single crystal, and a polycrystalline MgO film on Si substrate have been used in order to elucidate the role of the state of MgO surface in controlling the interface structure. It is found that at the interface of iron and MgO film, about two monolayers of Fe3O4 is formed. Fe3O4 being the oxide of iron with the highest heat of formation, the reaction appears to be controlled thermodynamically. On the other hand, on the interface with MgO (001) surface, FeO is formed, suggesting that the reaction is limited by the availability of oxygen atoms. Magnetic behaviour of the FeO layer gets modified significantly due to proximity effect of the bulk ferromagnetic iron layer.Comment: 6 figure

Origin of resistivity minima at low temperature in ferromagnetic metallic manganites

The resistivity and magnetoresistance measurements were carried out on thin film of La0.7Ca0.3MnO3 to investigate the possible origin of low temperature resistivity minimum observed in these samples. We observed large hysteresis in the magnetoresistance at low temperature; 5K and the sample current I has large effect on resistivity minima temperature. The observation of hysteresis at low temperatures suggests the presence of inhomogeneity at low temperatures. These in-homogeneities consist of regions of different resistive phases. It appears that the high resistive phase prevents the tunneling of charge carriers between two low resistive regions and thus giving rise to the resistivity minimum in these samples.Comment: Figure-3 and figure-4 are important new result

Tuning the Magnetic Ground State by Charge Transfer Energy in SrCoO2.5 via Strain Engineering

SrCoO2.5 (SCO) is a charge transfer insulator with 3d6 ground state configuration leading to antiferromagnetic nature. It is observed that substrate induced strain engineering modifies the ground state of SCO thin film with 3d7L (L:O-2p hole) configuration causing negative charge transfer energy.The consequent strong hybridization between O-2p and Co-3d bands causes a hole in O-2p band leading to hole mediated unconventional ferromagnetic ordering in SrCoO2.5 thin film. This opens up a new avenue to tune the electronic structure vis a vis magnetic property via strain engineering.Comment: 15 pages, 3 figure

Electrical and magnetic transport properties of Fe3O4 thin films on GaAs (100) substrate

Thin films of magnetite (Fe3O4) are grown on single crystal GaAs (100) substrate by pulsed laser deposition. X ray diffraction (XRD) result shows the (111) preferred orientation of the Fe3O4 film and x-ray photoelectron spectroscopy confirm the presence of single phase Fe3O4 in the film. The electrical transport property of the film shows the characteristic Verwey transition at 122 K and below 110 K, the transport follows variable range hopping type conduction mechanism. The film shows room temperature magnetization hysteresis loop suggesting the ferrimagnetic behavior of the film with saturation magnetization value close to 470 emu/cc.Comment: 16 pages, 5 figur

Density and Microstructure of Amorphous Carbon Thin Films

In this work, we studied amorphous carbon ($a$-C) thin films deposited using direct current (dc) and high power impulse magnetron sputtering (HiPIMS) techniques. The microstructure and electronic properties reveal subtle differences in $a$-C thin films deposited by two techniques. While, films deposited with dcMS have a smooth texture typically found in $a$-C thin films, those deposited with HiPIMS consist of dense hillocks surrounded by a porous microstructure. The density of $a$-C thin films is a decisive parameter to judge their quality. Often, x-ray reflectivity (XRR) has been used to measure the density of carbon thin films. From the present work, we find that determination of density of carbon thin films, specially those with a thickness of few tens of nm, may not be accurate with XRR due to a poor scattering contrast between the film and substrate. By utilizing neutron reflectivity (NR) in the time of flight mode, a technique not commonly used for carbon thin films, we could accurately measure differences in the densities of $a$-C thin films deposited using dcMS and HiPIMS.Comment: 6 pages, 5 figures, 2 table

Finding pathways for stoichiometric Co4N thin films

In this work, we studied the pathways for formation of stoichiometric \tcn~thin films. Polycrystalline and epitaxial \tcn~films were prepared using reactive direct current magnetron (dcMS) sputtering technique. A systematic variation in the substrate temperature (\Ts) during the dcMS process reveals that the lattice parameter (LP) decreases as \Ts~increases. We found that nearly stoichiometric \tcn~films can be obtained when \Ts~= 300\,K. However, they emerge from the transient state of Co target ($\phi$3\,inch). By reducing the target size to $\phi$1\,inch, now the \tcn~phase formation takes place from the metallic state of Co target. In this case, LP of \tcn~film comes out to be $\sim$99\p~of the value expected for \tcn. This is the largest value of LP found so far for \tcn. The pathways achieved for formation of polycrystalline \tcn~were adopted to grow an epitaxial \tcn~film, which shows four fold magnetic anisotropy in magneto-optic Kerr effect measurements. Detailed characterization using secondary ion mass spectroscopy indicates that N diffuses out when \Ts~is raised even to 400\,K. Measurement of electronic structure using x-ray photoelectron spectroscopy and x-ray absorption spectroscopy further confirms it. Magnetization measurements using bulk magnetization and polarized neutron reflectivity show that the saturation magnetization of stoichiometric \tcn~film is even larger than pure Co. Since all our measurements indicated that N could be diffusing out, when \tcn~films are grown at high \Ts, we did actual N self-diffusion measurements in a CoN sample and found that N self-diffusion was indeed substantially higher. The outcome of this work clearly shows that the \tcn~films grown prior to this work were always N deficient and the pathways for formation of a stoichiometric \tcn~have been achieved.Comment: 12 pages, 18 figure

Effect of strain on the electronic structure of La0.7Ca0.3MnO3

The effect of substrate strain on the electronic valence band structure of La0.7Ca0.3MnO3 thin films has been investigated. For this purpose La0.7Ca0.3MnO3 thin films have been simultaneously grown on SrTiO3 and LaAlO3 substrates using pulsed laser deposition technique. These samples were characterized by x-ray diffraction, x-ray reflectivity, core level x-ray photoelectron spectroscopy, and scanning electron microscopy measurements. Our experiments confirmed that all these samples have same chemical composition but different strain configuration. The electronic structure of these samples is probed through valence band spectroscopy measurements on Indus-1 synchrotron x-ray source. We observe that strain has large effect on the valence band electronic structure of La0.7Ca0.3MnO3. The results are explained on the basis of strain induced orbital occupancy and change in the crystal field splitting due to Mn-O bond length

Studies on temperature dependent semiconductor to metal transitions in ZnO thin films sparsely doped with Al

For a detailed study on the semiconductor to metal transition (SMT) in ZnO thin films doped with Al in the concentration range from 0.02 to 2%, we grew these films on (0001) sapphire substrates using sequential pulsed laser deposition. It was found that the Al concentration in the films increased monotonically with the ratio of ablation durations of the Alumina and ZnO targets used during the deposition. Using X-ray photo electron spectroscopy it was found that while most of the Al atoms occupy the Zn sites in the ZnO lattice, a small fraction of the Al also gets into the grain boundaries present in the films. The observed SMT temperature decreased from ~ 270 to ~ 50 K with increase in the Al concentration from 0.02 to 0.25 %. In the Al concentration range of ~ 0.5 to 2 % these doped ZnO films showed metallic behavior at all the temperatures without undergoing any SMT. A theoretical model based on thermal activation of electrons and electron scatterings due to the grain boundaries, ionic impurities and phonons has been developed to explain the observed concentration and temperature dependent SMT.Comment: 5 figures, 24 page

Magnetism and structure of in-situ grown FeN films studied using N K-edge XAS and nuclear resonance scattering

We studied the structural and magnetic properties of \textit{in-situ} grown iron mononitride (FeN) thin films. Initial stages of film growth were trapped utilizing synchrotron based soft x-ray absorption near edge spectroscopy (XANES) at the N $K$-edge and nuclear resonant scattering (NRS). Films were grown using dc-magnetron sputtering, separately at the experimental stations of SXAS beamline (BL01, Indus 2) and NRS beamline (P01, Petra III). It was found that the initial stages of film growth differs from the bulk of it. Ultrathin FeN films, exhibited larger energy separation between the t$_{2g}$ and e$_g$ features and an intense e$_g$ feature in the N $K$-edge pattern. This indicates that a structural transition is taking place from the rock-slat (RS)-type FeN to zinc-blende(ZB)-type FeN when the thickness of films increases beyond 5\,nm. The behavior of such N $K$-edge features correlates very well with the emergence of a magnetic component appearing in the NRS pattern at 100\,K in ultrathin FeN films. Combining the \textit{in-situ} XANES and NRS measurements, it appears that initial FeN layers grow in RS-type structure having a magnetic ground state. Subsequently, the structure changes to ZB-type which is known to be non-magnetic. Observed results help in resolving the long standing debate about the structure and the magnetic ground state of FeN.Comment: 9 pages, 5 figure