Entanglement in mutually unbiased bases

One of the essential features of quantum mechanics is that most pairs of observables cannot be measured simultaneously. This phenomenon is most strongly manifested when observables are related to mutually unbiased bases. In this paper, we shed some light on the connection between mutually unbiased bases and another essential feature of quantum mechanics, quantum entanglement. It is shown that a complete set of mutually unbiased bases of a bipartite system contains a fixed amount of entanglement, independently of the choice of the set. This has implications for entanglement distribution among the states of a complete set. In prime-squared dimensions we present an explicit experiment-friendly construction of a complete set with a particularly simple entanglement distribution. Finally, we describe basic properties of mutually unbiased bases composed only of product states. The constructions are illustrated with explicit examples in low dimensions. We believe that properties of entanglement in mutually unbiased bases might be one of the ingredients to be taken into account to settle the question of the existence of complete sets. We also expect that they will be relevant to applications of bases in the experimental realization of quantum protocols in higher-dimensional Hilbert spaces.Comment: 13 pages + appendices. Published versio

Integrated Photonic Sensing

Loss is a critical roadblock to achieving photonic quantum-enhanced technologies. We explore a modular platform for implementing integrated photonics experiments and consider the effects of loss at different stages of these experiments, including state preparation, manipulation and measurement. We frame our discussion mainly in the context of quantum sensing and focus particularly on the use of loss-tolerant Holland-Burnett states for optical phase estimation. In particular, we discuss spontaneous four-wave mixing in standard birefringent fibre as a source of pure, heralded single photons and present methods of optimising such sources. We also outline a route to programmable circuits which allow the control of photonic interactions even in the presence of fabrication imperfections and describe a ratiometric characterisation method for beam splitters which allows the characterisation of complex circuits without the need for full process tomography. Finally, we present a framework for performing state tomography on heralded states using lossy measurement devices. This is motivated by a calculation of the effects of fabrication imperfections on precision measurement using Holland-Burnett states.Comment: 19 pages, 7 figure