HIGHLY RELIABLE DESIGN BASED ON TSC CIRCUITS

Abstract. This paper deals with architecture of highly reliable digital circuits based on totally self checking blocks implemented in FPGAs. A duplex system is used as a basic structure of this reliable design. The whole design implemented in FPGA is divided into individual functional parts. Every part is modified to ensure totally self checking properties, which are calculated using our method of detailed fault classification. The reconfiguration process is utilized to increase reliability parameters. Combinational circuit benchmarks have been considered in this work to compute the quality of the adapted duplex system. The benchmarks are represented by two level networks (truth table). All of our experimental results are obtained by XILINX FPGA implementation by EDA tools

On-line Testing for FPGA

This paper focuses on the on-line error detection in circuits implemented in FPGAs. We have used error detection codes to ensure the self-checking property. A fault in a given combinational circuit has to be detected and signalized at the time of its appearance and before the further distribution of errors. Hence a safe operation of the designed system is guaranteed. The check bits generator and the checker were added to the original combinational circuit to detect an error during normal circuit operation called concurrent error detection and to ensure the Totally Self-Checking property. Only combinational circuits are considered. The benchmarks used in this work in order to compute a quality of the used code, are described by equations instead of tables, mainly used. All of our experiments assume their XILINX FPGA implementation. 1

Fault injection and simulation for fault tolerant reconfigurable duplex system

Abstract – The implementation and the fault simulation technique for the highly reliable digital design using two FPGAs under a processor control is presented. Two FPGAs are used for duplex system design, each including the combination of totally self-checking blocks based on parity predictors to obtain better dependability parameters. Combinatorial circuit benchmarks have been considered in all our experiments and computations. A Totally Self-Checking analysis of duplex system is supported by experimental results from our proposed FPGA fault simulator, where SEU-fault resistance is observed. Our proposed hardware fault simulator is compared also with the software simulation. An area overhead of individual parts implemented in each FPGA is also discussed. I