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6 research outputs found

Guest Editorial Process-Level Machine Learning Applications in Semiconductor Manufacturing

Author: Diebold Alain
Kyek Andreas
Lee Chia-Yen
Patel Nital S.
Susto Gian Antonio
Publication venue: 'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date: 01/01/2022
Field of study

Archivio istituzionale della ricerca - Università di Padova

Locally Adaptive Statistical Background Modeling With Deep Learning-Based False Positive Rejection for Defect Detection in Semiconductor Units

Author: Bashar M. Haddad
Lina J. Karam
Martin W. Braun
Nital S. Patel
Samuel F. Dodge
Publication venue: 'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
Field of study

Detection of Extended-Spectrum Beta Lactamases and AmpC Beta Lactamases Producing Uropathogenic Escherichia coli in a Tertiary Care Hospital

Author: Azap Ö et al.
Babypadmini S Appalaraju B.
Bhola Shankar Sah Manita Aryal, Dipak Bhargava, Amrullah Siddique.
Black JA Moland ES, Thomson KS.
Chakrawarti A Dongol P, Khanal H, Subba P, Banerjee JJ.
Chervet D et al.
Ebbing Lautenbach Jean Baldus Patel, Warren B. Bilker, Paul H. Edelstein, Neil O Fishman.
Fahad A et al.
Gupta V Garg R, Chander J.
Gupta V Yadav A, Joshi RM.
Jabeen K Zafir A, Hassan R.
Livermore DM
Mana Baziboroun Masomeh Bayani, Zahara Poormonstaseri, Mehran Shokri, Tahmineh Biazar.
Manchanda V Singh NP.
Naveen Grover Col AK, Sahni Brig, Bhattacharya S.
Neeraj Kumar Tulara.
Paterson DL Bonomo RA.
Rajendra Karadiya saroj Hooja, Nital Pal, Rajni Sharma, Rakesh Maheswari, Ramesh Mishra.
Rupinder Bakshi Geeta Walia, Anita Gupta.
Rupp M Fey PD.
Smita Sood Ravi Gupta.
Soha A el -hady, Lamiaa A Adel.
Umadevi S Kandha Kumari G, Joseph NM, Kumar S, Easow JM.
Vellanki Naga Madhavi Puppala Subbulu.
Yashavanth R Ronald R, Anita K, Narendra N, Faseela T.
Publication venue: 'Informatics Publishing Limited'
Publication date
Field of study

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