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1 research outputs found
Exposure assessment of process by-product nanoparticles released during the preventive maintenance of semiconductor fabrication facilities
Author
Bo-Xi Liao
Chuen-Jinn Tsai
+30 more
CJ Tsai
CN Liu
D Speed
DG Park
EA Kim
G Oberdörster
G Oberdörster
G Oberdörster
HW Chen
J Ojima
Jen-Kun Chen
KH Byun
KM Choi
KM Choi
M Shepard
MH Kim
MN Shepard
Neng-Chun Tseng
PV Broekhuizen
PV Broekhuizen
S Brenner
SA Brenner
SA Brenner
SC Gordon
SH Ham
SJ Tsai
WC Hinds
Y Ding
Yingshu Liu
Ziyi Li
Publication venue
'Springer Science and Business Media LLC'
Publication date
Field of study
No full text
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