16 research outputs found

    Observation of second-harmonic generation induced by pure spin currents

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    Extensive efforts are currently being devoted to developing a new electronic technology, called spintronics, where the spin of electrons is explored to carry information. [1,2] Several techniques have been developed to generate pure spin currents in many materials and structures. [3-10] However, there is still no method available that can be used to directly detect pure spin currents, which carry no net charge current and no net magnetization. Currently, studies of pure spin currents rely on measuring the induced spin accumulation with optical techniques [5, 11-13] or spin-valve configurations. [14-17] However, the spin accumulation does not directly reflect the spatial distribution or temporal dynamics of the pure spin current, and therefore cannot monitor the pure spin current in a real-time and real-space fashion. This imposes severe constraints on research in this field. Here we demonstrate a second-order nonlinear optical effect of the pure spin current. We show that such a nonlinear optical effect, which has never been explored before, can be used for the non-invasive, non-destructive, and real-time imaging of pure spin currents. Since this detection scheme does not rely on optical resonances, it can be generally applied in a wide range of materials with different electronic bandstructures. Furthermore, the control of nonlinear optical properties of materials with pure spin currents may have potential applications in photonics integrated with spintronics.Comment: 19 pages, 3 figures, supplementary discussion adde

    Three-Dimensional Image Processing for Acoustic Microscopy

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    We have built a scanning acoustic microscope operating in the 3–10 MHz range that measures both amplitude and phase [1,2]. This enables us to do image processing that cannot be done with amplitude or phase alone. We have demonstrated numerical enhancement of the transverse and depth resolution of the microscope. The transverse resolution is increased by approximately 20% and the depth resolution is doubled. We have applied this technique to measuring the profile of deep trenches (2 mm wide by 5 mm deep) which were designed as scale models of integrated circuit capacitors (2.5 µm wide by 6µm deep). These techniques could be used to characterize integrated circuits with an acoustic microscope operating at higher frequencies or with an optical microscope that measures amplitude and phase.</p
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