Characterisation of In2_2S3_3 and ZnO thin films for photovoltaic application using Photothermal deflection technique

ZnO and In$_2$S$_3$ thin films useful for photovoltaic application were studied using Photothermal deflection (PTD) spectroscopy. Mobility of carriers obtained from PTD was found to be in good agreement with reported values. Thickness measurements were also carried out. It was found to be in good agreement with stylus method