Crystallographic report : Aquadicylcohexyltin(IV) bis(2-picolinate) ethanol solvate

10.1002/aoc.558Applied Organometallic Chemistry18153-54AOCH

Silicon materials task of the low cost solar array project (Phase III). Effects of impurities and processing on silicon solar cells. Phase III summary and seventeenth quarterly report, Volume 2: analysis of impurity behavior

The object of this phase of the program has been to investigate the effects of various processes, metal contaminants and contaminant-process interactions on the properties of silicon and on the performance of terrestrial silicon solar cells. The study encompassed topics including thermochemical (gettering) treatments, base doping concentration, base doping type (n vs. p), grain boundary-impurity interaction, non-uniformity of impurity distribution, long term effects of impurities, as well as synergic and complexing phenomena. The program approach consists in: (1) the growth of doubly and multiply-doped silicon single crystals containing a baseline boron or phosphorus dopant and specific impurities which produce deep levels in the forbidden band gap; (2) assessment of these crystals by chemical, microstructural, electrical and solar cell tests; (3) correlation of the impurity type and concentration with crystal quality and device performance; and (4) delineation of the role of impurities and processing on subsequent silicon solar cell performance. The overall results reported are based on the assessment of nearly 200 silicon ingots. (WHK

Silicon materials task of the low cost solar array project (Phase III). Effect of impurities and processing on silicon solar cells. Fifteenth quarterly report, April-June 1979

The overall objective of this program is to define the effects of impurities, various thermochemical processes, and any impurity-process interactions on the performance of terrestrial silicon solar cells. The results of the study form a basis for silicon producers, wafer manufacturers, and cell fabricators to develop appropriate cost-benefit relationships for the use of less pure, less costly Solar Grade silicon. The first reported determinations of the segregation coefficients of tungsten, tantalum, and cobalt for the Czochralski pulling of silicon single crystals were performed. Sensitive neutron activation analysis was used to determine the metal impurity content of the silicon (C/sub S/) while atomic absorption was used to measure the metal content of the residual liquid (C/sub L/) from which the doped crystals were grown. Gettering of Ti-doped silicon wafers improves cell performance by 1 to 2% (absolute) for the highest temperatures and longest times. The measured profile for Ti centers formed after an 850/sup 0/C gettering operation was fitted by a mathematical expression for the out-diffusion of an impurity species. By means of cell performance data and the newly-measured segregation coefficients curves were computed to predict the variation in cell efficiency with impurity concentration for Mo, Ta, W, Nb, and Co, materials commonly employed in the construction of high temperature silicon processing equipment. Using data for second and third generation n-base ingots the cell performance curves were updated for single impurities in n-type silicon. Most impurities degrade n-base cells less than p-base devices. The effect is larges for Mo, Al, Mn, Ti, and V while Fe and Cr behave much the same in both types of solar cells. In contrast Ni and Cu both degrade n-base devices (apparently by a junction mechanism) more severely than p-base cells. (WHK

Silicon materials task of the low cost solar array project (Phase III). Effect of impurities and processing on silicon solar cells. Phase III summary and seventeenth quarterly report, Volume 1: characterization methods for impurities in silicon and impurity effects data base

The object of Phase III of the program has been to investigate the effects of various processes, metal contaminants and contaminant-process interactions on the performance of terrestrial silicon solar cells. The study encompassed a variety of tasks including: (1) a detailed examination of thermal processing effects, such as HCl and POCl/sub 3/ gettering on impurity behavior, (2) completion of the data base and modeling for impurities in n-base silicon, (3) extension of the data base on p-type material to include elements likely to be introduced during the production, refining, or crystal growth of silicon, (4) effects on cell performance on anisotropic impurity distributions in large CZ crystals and silicon webs, and (5) a preliminary assessment of the permanence of the impurity effects. Two major topics are treated: methods to measure and evaluate impurity effects in silicon and comprehensive tabulations of data derived during the study. For example, discussions of deep level spectroscopy, detailed dark I-V measurements, recombination lifetime determination, scanned laser photo-response, and conventional solar cell I-V techniques, as well as descriptions of silicon chemical analysis are included. Considerable data are tabulated on the composition, electrical, and solar cell characteristics of impurity-doped silicon

Method Diffusion as a Social Movement

This paper describes an investigation into the diffusion of information systems development methods (ISDMs). We portray method diffusion as an instance of technological diffusion. Technological diffusion is normally portrayed within the IS industry as an overtly rational process. In this paper, we postulate that the external diffusion process of ISDMs has many features in common with broader social movements and test a model of knowledge-based diffusion. We use the case of the recent history of the dynamic systems development method (DSDM), a public domain standard methodology for rapid application development (RAD), to illustrate some of the key features of method diffusion processes within a UK context