Investigation of the X-ray diffraction properties of a synthetic multilayer. 1998 summer research program for high school juniors at the University of Rochester`s Laboratory for Laser Energetics: Student research reports

In this investigation spectroscopy was used to evaluate the x-ray diffraction properties of a synthetic WB{sub 4}C multilayer for possible use in the OMEGA gated monochromatic x-ray imager (GMXI). The multilayer was placed on a diffractometer, and measurements were made with a lithium-drifted silicon [Si(Li)] x-ray detector, connected to a multi-channel analyzer. The properties of the multilayer were inferred from gaussian fits to the measured diffraction curves. A multilayer with a 2d spacing of 25 {angstrom} was tested at energies from 1.7 to 4.5 keV