10 research outputs found

    Absolute calibration method for fast-streaked, fiber optic light collection, spectroscopy systems.

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    This report outlines a convenient method to calibrate fast (<1ns resolution) streaked, fiber optic light collection, spectroscopy systems. Such a system is used to collect spectral data on plasmas generated in the A-K gap of electron beam diodes fielded on the RITS-6 accelerator (8-12MV, 140-200kA). On RITS, light is collected through a small diameter (200 micron) optical fiber and recorded on a fast streak camera at the output of 1 meter Czerny-Turner monochromator (F/7 optics). To calibrate such a system, it is necessary to efficiently couple light from a spectral lamp into a 200 micron diameter fiber, split it into its spectral components, with 10 Angstroms or less resolution, and record it on a streak camera with 1ns or less temporal resolution

    Investigations of shot reproducibility for the SMP diode at 4.5 MV.

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    In experiments conducted on the RITS-6 accelerator, the SMP diode exhibits sig- ni cant shot-to-shot variability. Speci cally, for identical hardware operated at the same voltage, some shots exhibit a catastrophic drop in diode impedance. A study is underway to identify sources of shot-to-shot variations which correlate with diode impedance collapse. To remove knob emission as a source, only data from a shot series conducted with a 4.5-MV peak voltage are considered. The scope of this report is limited to sources of variability which occur away from the diode, such as power ow emission and trajectory changes, variations in pulsed power, dustbin and transmission line alignment, and di erent knob shapes. We nd no changes in the transmission line hardware, alignment, or hardware preparation methods which correlate with impedance collapse. However, in classifying good versus poor shots, we nd that there is not a continuous spectrum of diode impedance behavior but that the good and poor shots can be grouped into two distinct impedance pro les. This result forms the basis of a follow-on study focusing on the variability resulting from diode physics.
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