1 research outputs found
A New Look at Patent Quality: Relating Patent Prosecution to Validity
- Author
- Adamb Jaffe
- Adamb Jaffe
- Adamb Jaffe
- Arti K Rai
- Bronwynh Hall
- Clarisa Long
- Craig Nard
- Dan L Burk
- Donalda Dunner
- Dougandmarka Lichtman
- Douglas Lichtman
- Eleftherios Sapsalis
- Harhoff
- James Bessen
- James Bessen
- Jasjit Singh
- Jasjit Singh
- Jasjit Singh
- Jasonandwalterw Owensmith
- Jean Lanjouw
- John R Allison
- John R Allison
- Johnr Allison
- Juan Alc�cer
- Juan Alc�cer
- Keving Rivette
- Kimberlya Moore
- M F Porter
- Marian Underweiser
- Mark A Lemley
- Mark A Lemley
- Mark A Lemley
- Marka Lemley
- Markus Reitzig
- Olavandjasjitsingh Sorenson
- Peter Thompson
- Peter Thompson
- Rebecca Henderson
- Rebecca Henderson
- Robertp Merges
- Ronald J. Mann
- Stefan Wuchty
- Stuart Benjamin
- U S Officeofinspectorgeneral
- Unitedstatespatentandtrademarkoffice
- Zhenandbrianwright Lei
- Publication venue
- 'Elsevier BV'
- Publication date
- 01/01/2010
- Field of study