167 research outputs found
Atomen in actie
Met elektronenmicroscopen is het mogelijk om afzonderlijke atomen in beeld te brengen, maar alleen als ze absoluut stilstaan. Wat er feitelijk gebeurt op atomaire schaal, bijvoorbeeld tijdens een chemische reactie, een faseovergang in een metaal, of als een eiwit zich vouwt, is nog nauwelijks in beeld gebracht. Dat komt doordat atomen meestal veel te snel bewegen om ze met conventionele technieken te kunnen volgen. Om atomen in actie te kunnen filmen, zo laat Luiten zien, zijn de ontwikkeling van exotische bundeltechnieken en het verkennen van uiterste grenzen vereist. De toevoeging van de tijdsdimensie aan het onderzoek van de nanowereld realiseert een wetenschappelijke droom, met belangrijke implicaties voor de maatschappij
Design and optimization of a 100 keV DC/RF ultracold electron source
An ultracold electron source based on near-threshold photoionization of a laser-cooled and trapped atomic gas is presented in this work. Initial DC acceleration to 10 keV and subsequent acceleration of the created bunches to 100 keV by RF fields makes the design suitable to serve as injector for accelerator-based light sources, single-shot ultrafast protein crystallography, applications in dielectric laser acceleration schemes, and potentially as an injector for free electron lasers operating in the quantum regime. This paper presents the design and properties of the developed DC/RF structure. It is shown that operation at a repetition frequency of 1 kHz is achievable and detailed particle tracking simulations are presented showing the possibility of achieving a brightness that can exceed conventional RF photosources
A tabletop soft X-ray source based on 5-10 MeV LINACs
We are investigating the feasibility of a novel, tabletop, high-brightness soft X-ray source
A bright ultracold atoms-based electron source
An important application of pulsed electron sources is Ultrafast Electron Diffraction [1]. In this technique, used e.g. in chemistry, biology and condensed matter physics, one can observe processes that take place at the microscopic level with sub-ps resolution. To reach the holy grail of UED, single-shot diffraction images of biologically relevant molecules, electron bunches of 1pC charge, 100fs length and 10nm coherence length are required. Conventional pulsed electron sources cannot fulfil these requirements, but according to the simulations reported in [2] and [3] a new type of source can.The new source combines the use of magneto-optical atom trapping with fast high voltage technology. We start by cooling and trapping rubidium atoms, followed by ionisation just above threshold, leading to an ultracold plasma. Another possibility is to excite the atoms into a high Rydberg level, from which they spontaneously evolve into an ultracold plasma. Applying a fast high voltage pulse, electron bunches can be extracted. In an initial study [2] it has been shown that this type of source can provide a very high brightness. Depending on the initial particle distribution, the reduced brightness can be in the order of 1x109 A/(rad2m2V), which is orders of magnitude higher than established technology such as an electron photogun can provide.Here we report the first experiments toward realisation of the source. Here, a simple accelerator structure consists of four bars surrounding a MOT, on which an 800V pulsed voltage with a rise time of 1ƒÝs is applied. An MCP together with a phosphor screen and a CCD camera are used as detection system. The bunch size obtained from the phosphor screen is fitted with a Gaussian distribution, from which the electron temperature is extracted. For small extracted charges, the electron temperature is found to have an upper limit of 500K, the measurement being limited by stray magnetic fields due to the low electron energy (10eV). We have also extracted a pulsed ion beam by reversing the sign of the accelerating voltage. Since ions are heavier, they obtain higher energy and are less influenced by the magnetic fields. The temperature in this case is found to b
Coherent radiation reaction effects in laser-vacuum acceleration of electron bunches
The effects of coherently enhanced radiation reaction on the motion of
subwavelength electron bunches in interaction with intense laser pulses are
analyzed. The radiation reaction force behaves as a radiation pressure in the
laser beam direction, combined with a viscous force in the perpendicular
direction. Due to Coulomb expansion of the electron bunch, coherent radiation
reaction effects only occur in the initial stage of the laser-bunch interaction
while the bunch is still smaller than the wavelength. It is shown that this
initial stage can have observable effects on the trajectory of the bunch. By
scaling the system to larger bunch charges, these effects may be increased to
such an extent that they can suppress the radial instability normally found in
ponderomotive acceleration schemes, thereby enabling the full potential of
laser-vacuum electron bunch acceleration to GeV energies.Comment: 31 pages, 4 figure
Beam pulsing device for use in charged-particle microscopy
A charged-particle microscope comprising: - A charged-particle source, for producing a beam of charged particles that propagates along a particle-optical axis; - A sample holder, for holding and positioning a sample; - A charged-particle lens system, for directing said beam onto a sample held on the sample holder; - A detector, for detecting radiation emanating from the sample as a result of its interaction with the beam; - A beam pulsing device, for causing the beam to repeatedly switch on and off so as to produce a pulsed beam, wherein the beam pulsing device comprises a unitary resonant cavity disposed about said particle-optical axis and having an entrance aperture and an exit aperture for the beam, which resonant cavity is embodied to simultaneously produce a first oscillatory deflection of the beam at a first frequency in a first direction and a second oscillatory deflection of the beam at a second, different frequency in a second, different direction. The resonant cavity may have an elongated (e.g. rectangular or elliptical) cross-section, with a long axis parallel to said first direction and a short axis parallel to said second direction
Transverse self-fields within an electron bunch moving in an arc of a circle
As a consequence of motions driven by external forces, self-fields (which are
different from the static case) originate within an electron bunch. In the case
of magnetic external forces acting on an ultrarelativistic beam, the
longitudinal self-interactions are responsible for CSR (Coherent Synchrotron
Radiation)-related phenomena, which have been studied extensively. On the other
hand, transverse self-interactions are present too. At the time being, existing
theoretical analysis of transverse self-forces deal with the case of a bunch
moving along a circular orbit only, without considering the situation of a
bending magnet with a finite length. In this paper we propose an
electrodynamical analysis of transverse self-fields which originate, at the
position of a test particle, from an ultrarelativistic electron bunch moving in
an arc of a circle. The problem will be first addressed within a two-particle
system. We then extend our consideration to a line bunch with a stepped density
distribution, a situation which can be easily generalized to the case of an
arbitrary density distribution. Our approach turns out to be also useful in
order to get a better insight in the physics involved in the case of simple
circular motion and in order to address the well known issue of the partial
compensation of transverse self-force.Comment: 23 pages, 14 figure
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