5 research outputs found
High-flux ultrafast extreme-ultraviolet photoemission spectroscopy at 18.4 MHz pulse repetition rate
Imaging at the mesoscale (leem, peem)
1noThe capability to display images containing chemical, magnetic, and structural information and to perform spectroscopy and diffraction from a μm-sized area makes cathode lens electron microscopy one of the most used and reliable techniques to analyze surfaces at the mesoscale. Thanks to its versatility, LEEMlow-energyelectron microscopy (LEEM)/PEEM systems are currently employed to study model systems in the fields of nanotechnology, nanomagnetism, material science, catalysis, energy storage, thin films, and 2-D (two-dimensional) materials. In this chapter, we will present a brief but complete review of this class of instruments. After a historical digression in the introductory section, we will first show the basic operating principles of a simple setup and then the elements that can be added to improve performance. Later, two sections will be dedicated to LEEM and PEEMphotoelectronemission microscopy (PEEM), respectively. In both cases, a theoretical discussion on the contrast mechanisms will prelude to a showcase of the operating modes of the instrument, with clear examples that will show the best performance available today. Finally, a brief discussion about the future developments of cathode lens electron microscopy will close the chapter.reservedmixedSala A.Sala, A