Comparison of Residual Stress Measurement Techniques and Implementation Using X-Ray Diffraction

Abstract. Regardless of the particular residual stress (RS) measurement technique being used, all are based on the same basic principles when using x-ray diffraction (XRD). Every technique has both its advantages and disadvantages, many of which are well known to engineers and scientists however, some of the important "finer points" are unfortunately not widely discussed or known by those not well versed in the subject. This paper will try to bring to light many of these commonly misunderstood issues by comparing the different techniques and attempt to illuminate the associated problems a user may encounter when measurements become challenging i.e. when RS measurements are to be performed in tight grooves or on textured materials for example. In this study, different techniques including the: Cosα technique, MET (used in Psi, Omega, or Modified Psi mode) have been evaluated and tested on a variety of materials and geometries. Introduction RS measurements using XRD techniques were first performed as early as 1925 In this study, different techniques including the: Cosα technique, MET (used in Psi, Omega, or Modified Psi mode) will be evaluated and tested on a variety of materials and geometries. This paper will emphasize the different findings and the limitations associated with each of the techniques evaluated