Development of a Rapid Temperature Scanning System for Pulsed Magnetic Fields and its Applications

AbstractAn apparatus, which scans temperature in sub-seconds for measuring the temperature dependence of the resistivity, is proposed. This apparatus contains a thermal bath and a sample platform on which a thin-film thermometer and a thin-film heater are sputtered. By thermally isolating the sample platform from surrounding parts, the sample temperature can be scanned at a high sweep rate of 200-300K/s. As a demonstration of the apparatus, the resistivity of a niobium-titanium alloy is measured in a pulsed magnetic field. In addition, as another application of the apparatus, the dielectric polarization measurement of the quantum-paraelectric material SrTiO3 is described

Thermodynamic Study on the Metamagnetism in Heavy Fermions

学位の種別: 課程博士審査委員会委員 : （主査）東京大学教授 上床 美也, 東京大学教授 常次 宏一, 東京大学准教授 近藤 猛, 東京大学准教授 徳永 将史, 東京大学講師 北川 健太郎University of Tokyo(東京大学