Retrieval of depth profile of nano scale thin films by one directional polarization analysis in neutron specular reflectometry

Recently it has been shown that the modules and phase of complex reflection coefficient can be determined by using a magnetic substrate and polarized neutrons. Several other methods have also been worked out based on measurement of polarizations of reflected neutrons from magnetic reference layers and magnetic substrate. However, due to the fact that available reflectometers are limited in the choice of polarization of reflected beam in the same direction as the polarization of the incident beam, neither of the methods which are based on polarization analysis, has been proven to be experimentally practical. In this paper, we have proposed a new method for determining the phase of reflection coefficient which is based on two measurements of polarization which correspond to two magnetic fields with the same magnitudes and different orientations. The polarization analysis is performed in the same direction as the polarization of the incident beam and is well suited for available reflectometers. The problems envisaged in implementation of the method are also discussed.Comment: 5 pages, 6 figure

Detection of nano scale thin films with polarized neutron reflectometry at the presence of smooth and rough interfaces

By knowing the phase and modules of the reflection coefficient in neutron reflectometry problems, a unique result for the scattering length density (SLD) of a thin film can be determined which will lead to the exact determination of type and thickness of the film. In the past decade, several methods have been worked out to resolve the phase problem such as dwell time method, reference layer method and variation of surroundings, among which the reference method and variation of surroundings by using a magnetic substrate and polarized neutrons is of the most applicability. All of these methods are based on the solution of Schrodinger equation for a discontinuous and step-like potential at each interface. As in real sample there are some smearing and roughness at boundaries, consideration of smoothness and roughness of interfaces would affect the final output result. In this paper, we have investigated the effects of smoothness of interfaces on determination of the phase of reflection as well as the retrieval process of the SLD, by using a smooth varying function (Eckart potential). The effects of roughness of interfaces on the same parameters, have also been investigated by random variation of the interface around it mean position