Measurement and calculation of PZT thin film longitudinal piezoelectric coefficients.

The ferroelectric and piezoelectric properties of 2000 {angstrom} thick chemical solution deposited Pb(Zr{sub x}Ti{sub 1{minus}x})O{sub 3} (PZT) thin films were investigated. Several Zr/Ti ratios were studied: 30/70, 50/50 and 65/35, which correspond to tetragonal, near-morphotropic, and rhombohedral symmetries. In all samples, a {l_brace}111{r_brace}-texture is predominant. Longitudinal piezoelectric coefficients and their dc field dependence were measured using the contact AFM method. The expected trend of a maximum piezoelectric coefficient at or near to the MPB was not observed. The composition dependence was small, with the maximum d{sub 33} occurring in the tetragonal material. To explain the results, crystallographic texture and film thickness effects are suggested. Using a modified phenomenological approach, derived electrostrictive coefficients, and experimental data, d{sub 33} values were calculated. Qualitative agreement was observed between the measured and calculated coefficients. Justifications of modifications to the calculations are discussed

Potassium-sodium-rubidium niobate single crystals and electric properties

Potassium-sodium-rubidium niobate single crystals are grown using an original pulling down method, to improve their composition change during a crystal growth, by means of co-doping of small ionic size sodium and large ionic size rubidium into potassium niobate. Even by the co-doping, single crystals can be grown with orthorhombic single-phase at room temperature, as well as pure potassium niobate. Their electric properties, such as the dielectric constant and the impedance, are changed depending on the doping ions