Thermal activation Eyring energy approach to characterise the dependence of nanoscale friction on the surface roughness

Atomic Force Microscope (AFM) is used to characterise the frictional response of surfaces with varying roughness parameters in dry and in the presence of fully formulated lubricants. The surface roughness has shown to affect nanoscale friction. The characteristics involved the investigation of roughness, small-scale adhesive forces and nanoscale friction using AFM in lateral force mode. The fluid-cell Lateral Force Microscopy (LFM) results were used to model thermal activation Eyring energy components in conjunction with the relevant continuum contact mechanics model. The paper shows that a combination of LFM, for dry and fluid-cell LFM and thermal activation Eyring energy barrier approach is a useful tool to explain the effect of surface roughness on nanoscale friction.<br