2-Amino­pyridinium diphenyl­phosphinate monohydrate

In the crystal of the title hydrated salt, C5H7N2 +·C12H10O2P−·H2O, the cations, anions and water mol­ecules connected by N—H⋯O and O—H⋯O hydrogen bonds into a layer along the bc plane; the phenyl rings protrude into the space between the layers. The dihedral angle between rings of anion is 86.1 (1)°

1-Benzyl-2-(4-chloro­phen­yl)-4,5-di­phenyl-1H-imidazole

The mol­ecular conformation of the title compound, C28H21ClN2, is stabilized by an intra­molecular C—H⋯N hydrogen bond. It has many pharmacological properties, such as being an inhibitor of P38 MAP Kinase, and can play an important role in biochemical processes

Direct Growth of High Mobility and Lowâ Noise Lateral MoS2â Graphene Heterostructure Electronics

Peer Reviewedhttps://deepblue.lib.umich.edu/bitstream/2027.42/138199/1/smll201604301_am.pdfhttps://deepblue.lib.umich.edu/bitstream/2027.42/138199/2/smll201604301.pdfhttps://deepblue.lib.umich.edu/bitstream/2027.42/138199/3/smll201604301-sup-0001-S1.pd

Synthesis and characterization of CdTe nanostructures grown by RF magnetron sputtering method

In this paper, we synthesize Cadmium Telluride nanostructures by radio frequency (RF) magnetron sputtering system on soda lime glass at various thicknesses. The effect of CdTe nanostructures thickness on crystalline, optical and morphological properties has been studied by means of X-ray diffraction (XRD), UV-VIS-NIR spectrophotometry, field emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM), respectively. The XRD parameters of CdTe nanostructures such as microstrain, dislocation density, and crystal size have been examined. From XRD analysis, it could be assumed that increasing deposition time caused the formation of the wurtzite hexagonal structure of the sputtered films. Optical properties of the grown nanostructures as a function of film thickness have been observed. All the films indicate more than 60% transmission over a wide range of wavelengths. The optical band gap values of the films have obtained in the range of 1.62–1.45 eV. The results indicate that an RF sputtering method succeeded in depositing of CdTe nanostructures with high purity and controllable physical properties, which is appropriate for photovoltaic and nuclear detector applications